Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387318 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2025-08-12 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2024-02-13 |
| 10872406 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung +6 more | 2020-12-22 |
| 9525024 | Methods for introducing carbon to a semiconductor structure and structures formed thereby | Yu Su, Huang-Ming Chen, Chun-Feng Nieh | 2016-12-20 |
| 9105570 | Methods for introducing carbon to a semiconductor structure | Yu Su, Huang-Ming Chen, Chun-Feng Nieh | 2015-08-11 |
| 8970015 | Method for protecting a gate structure during contact formation | Hong-Dyi Chang, Kong-Beng Thei, Hun-Jan Tao, Harry-Hak-Lay Chuang | 2015-03-03 |
| 8648446 | Method for protecting a gate structure during contact formation | Hong-Dyi Chang, Kong-Beng Thei, Hun-Jan Tao, Harry-Hak-Lay Chuang | 2014-02-11 |
| 8497169 | Method for protecting a gate structure during contact formation | Hong-Dyi Chang, Kong-Beng Thei, Hun-Jan Tao, Harry-Hak-Lay Chuang | 2013-07-30 |
| 8202776 | Method for protecting a gate structure during contact formation | Hong-Dyi Chang, Kong-Beng Thei, Hun-Jan Tao, Harry-Hak-Lay Chuang | 2012-06-19 |