Issued Patents All Time
Showing 25 most recent of 72 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12147033 | Scanning micro profiler | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2024-11-19 |
| 12146732 | Surface contour measurement | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2024-11-19 |
| 12146830 | Slope, p-component and s-component measurement | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2024-11-19 |
| 12130243 | Angle independent optical surface inspector | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2024-10-29 |
| 11988615 | Region prober optical inspector | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2024-05-21 |
| 11852592 | Time domain multiplexed defect scanner | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2023-12-26 |
| 11733173 | Time domain multiplexed defect scanner | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2023-08-22 |
| 11255796 | Region prober optical inspector | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2022-02-22 |
| 10769769 | Dual mode inspector | Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, James Jianguo Xu | 2020-09-08 |
| 10767977 | Scattered radiation defect depth detection | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2020-09-08 |
| 10648928 | Scattered radiation optical scanner | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2020-05-12 |
| 10641713 | Phase retardance optical scanner | Hung Phi Nguyen, Alireza Shahdoost Moghaddam | 2020-05-05 |
| 10338009 | Method and apparatus to detect defects in transparent solids | Ronny Soetarman | 2019-07-02 |
| 10094787 | Multi-surface specular reflection inspector | Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen | 2018-10-09 |
| 9921169 | Method of detecting defect location using multi-surface specular reflection | Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen | 2018-03-20 |
| 9784691 | Method and apparatus to optically detect defects in transparent solids | Ronny Soetarman | 2017-10-10 |
| 9163987 | Defect inspection and photoluminescence measurement system | Roman Sappey | 2015-10-20 |
| 8896825 | Optical inspector | Rusmin Kudinar, Hung Phi Nguyen | 2014-11-25 |
| 8848181 | Multi-surface scattered radiation differentiation | Rusmin Kudinar, Hung Phi Nguyen | 2014-09-30 |
| 8836935 | Optical inspector with selective scattered radiation blocker | Rusmin Kudinar, Hung Phi Nguyen | 2014-09-16 |
| 8830457 | Multi-surface optical inspector | Rusmin Kudinar, Hung Phi Nguyen | 2014-09-09 |
| 8830456 | Optical inspector | Rusmin Kudinar, Hung Phi Nguyen | 2014-09-09 |
| 8823935 | Detecting and classifying surface defects with multiple radiation collectors | Xiaoqian Xu, Hung Phi Nguyen, Alireza Shahdoost Moghadam, Mahendra Prabhu Ramachandran | 2014-09-02 |
| 8736831 | Substrate inspection | Mahendra Prabhu Ramachandran, Romain Sappey | 2014-05-27 |
| 8325334 | Substrate edge inspection | Mahendra Prabhu Ramachandran, Alireza Shahdoost Moghadam, Hung Phi Nguyen | 2012-12-04 |