Issued Patents All Time
Showing 51–72 of 72 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7061601 | System and method for double sided optical inspection of thin film disks or wafers | — | 2006-06-13 |
| 6956660 | System and method for measuring properties of an object using a phase difference between two reflected light signals | Rusmin Kudinar | 2005-10-18 |
| 6956658 | System and method for measuring object characteristics using phase differences in polarized light reflections | Rusmin Kudinar | 2005-10-18 |
| 6930765 | Multiple spot size optical profilometer, ellipsometer, reflectometer and scatterometer | Hung Phi Nguyen | 2005-08-16 |
| 6909500 | Method of detecting and classifying scratches, particles and pits on thin film disks or wafers | — | 2005-06-21 |
| 6897957 | Material independent optical profilometer | — | 2005-05-24 |
| 6781103 | Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks | Gale A. Lane | 2004-08-24 |
| 6757056 | Combined high speed optical profilometer and ellipsometer | Rusmin Kudinar | 2004-06-29 |
| 6751044 | Method and apparatus for reading a clock track with a magneto-optical clock head using the transverse Kerr effect | Richard LeSage, David S. McMurtrey, Peter R. Svendsen, W. Craig Tomalty | 2004-06-15 |
| 6717671 | System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern | Rusmin Kudinar | 2004-04-06 |
| 6704435 | Surface inspection tool | Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung +2 more | 2004-03-09 |
| 6665078 | System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers | Rusmin Kudinar | 2003-12-16 |
| 6624884 | Surface inspection tool | Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung +2 more | 2003-09-23 |
| 6392749 | High speed optical profilometer for measuring surface height variation | Rusmin Kudinar | 2002-05-21 |
| 6268919 | System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations | Rusmin Kudinar, Ronny Soetarman | 2001-07-31 |
| 6229610 | System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation | Rusmin Kudinar, Ronny Soetarman | 2001-05-08 |
| 6198533 | High temperature thin film property measurement system and method | Rusmin Kudinar, Ronny Soetarman | 2001-03-06 |
| 6130749 | System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation | Rusmin Kudinar, Ronny Soetarman | 2000-10-10 |
| 6031615 | System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness | Rusmin Kudinar, Ronny Soetarman | 2000-02-29 |
| 5777815 | Disk drive with shock detection based on thermoresistive signal from magnetoresistive head | Prakash Kasiraj, Timothy C. Reiley | 1998-07-07 |
| 5586040 | Process and apparatus for controlled laser texturing of magnetic recording disk | Peter Michael Baumgart, Christopher S. Gudeman, Douglas J. Krajnovich, Thao A. Nguyen, Fior D. Sargent +2 more | 1996-12-17 |
| 5539213 | Process and apparatus for laser analysis of surface having a repetitive texture pattern | Thao A. Nguyen, Fior D. Sargent | 1996-07-23 |