Issued Patents All Time
Showing 26–50 of 72 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7907269 | Scattered light separation | — | 2011-03-15 |
| 7714995 | Material independent profiler | — | 2010-05-11 |
| 7688435 | Detecting and classifying surface features or defects by controlling the angle of the illumination plane of incidence with respect to the feature or defect | — | 2010-03-30 |
| 7684032 | Multi-wavelength system and method for detecting epitaxial layer defects | — | 2010-03-23 |
| 7656519 | Wafer edge inspection | Rusmin Kudinar | 2010-02-02 |
| 7630086 | Surface finish roughness measurement | Dave S. Oak, Tri Do, Ronny Soetarman, Vamsi Velidandla | 2009-12-08 |
| 7554654 | Surface characteristic analysis | Romain Sappey, Tom Carr | 2009-06-30 |
| 7532318 | Wafer edge inspection | Rusmin Kudinar, William R. Wheeler, Hung Phi Nguyen, Vamsi Velidandla, Anoop Somanchi +1 more | 2009-05-12 |
| 7397621 | Servo pattern characterization on magnetic disks | Zhen Hou, Ronny Soetarman, Vamsi Velidandla | 2008-07-08 |
| 7397553 | Surface scanning | Courosh Mehanian, Eliezer Rosengaus | 2008-07-08 |
| 7362425 | Wide spatial frequency topography and roughness measurement | Mahendra Prabhu Ramachandran, Alireza Shahdoost Moghadam | 2008-04-22 |
| 7345751 | Material independent optical profilometer | — | 2008-03-18 |
| 7295300 | Detecting surface pits | Laurie Bechtler, Vamsi Velidandla | 2007-11-13 |
| 7286229 | Detecting multi-domain states in perpendicular magnetic media | — | 2007-10-23 |
| 7274445 | Confocal scatterometer and method for single-sided detection of particles and defects on a transparent wafer or disk | — | 2007-09-25 |
| 7218391 | Material independent optical profilometer | — | 2007-05-15 |
| 7190447 | Double sided optical inspection of thin film disks or wafers | — | 2007-03-13 |
| 7161669 | Wafer edge inspection | Vamsi Velidandla, Anoop Somanchi, Ronny Soetarman | 2007-01-09 |
| 7161668 | Wafer edge inspection | Rusmin Kudinar, William R. Wheeler, Hung Phi Nguyen | 2007-01-09 |
| 7161667 | Wafer edge inspection | Rusmin Kudinar, William R. Wheeler, Hung Phi Nguyen | 2007-01-09 |
| 7123357 | Method of detecting and classifying scratches and particles on thin film disks or wafers | — | 2006-10-17 |
| 7113284 | Material independent optical profilometer | — | 2006-09-26 |
| 7110097 | Combined high speed optical profilometer and ellipsometer | Rusmin Kudinar | 2006-09-19 |
| 7075630 | Combined high speed optical profilometer and ellipsometer | Rusmin Kudinar | 2006-07-11 |
| 7075741 | System and method for automatically determining magnetic eccentricity of a disk | Ronny Soetarman, Vamsi Velidandla, Jimmy Chun-Chuen Leung | 2006-07-11 |