Issued Patents All Time
Showing 1–25 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265212 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2025-04-01 |
| 11536940 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2022-12-27 |
| 11294161 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2022-04-05 |
| 10884228 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2021-01-05 |
| 10769769 | Dual mode inspector | Steven W. Meeks, Ronny Soetarman, Hung Phi Nguyen, James Jianguo Xu | 2020-09-08 |
| 10209501 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen +1 more | 2019-02-19 |
| 10094787 | Multi-surface specular reflection inspector | Steven W. Meeks, Ronny Soetarman, Hung Phi Nguyen | 2018-10-09 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2018-08-14 |
| 9921169 | Method of detecting defect location using multi-surface specular reflection | Steven W. Meeks, Ronny Soetarman, Hung Phi Nguyen | 2018-03-20 |
| 9664888 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetaman, Zhen Hou, James Jianguo Xu, Vamsi Velidandla +1 more | 2017-05-30 |
| 9645381 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetaman, Zhen Hou, James Jianguo Xu, Vamsi Velidandla +1 more | 2017-05-09 |
| 9389408 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen +1 more | 2016-07-12 |
| 9036869 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetarman, Zhen Hou, James Jianguo Xu, Vamsi Velidandla +1 more | 2015-05-19 |
| 8976366 | System and method for monitoring LED chip surface roughening process | James Jianguo Xu, Ken Kinsun Lee, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2015-03-10 |
| 8896825 | Optical inspector | Steven W. Meeks, Hung Phi Nguyen | 2014-11-25 |
| 8848181 | Multi-surface scattered radiation differentiation | Steven W. Meeks, Hung Phi Nguyen | 2014-09-30 |
| 8836935 | Optical inspector with selective scattered radiation blocker | Steven W. Meeks, Hung Phi Nguyen | 2014-09-16 |
| 8830457 | Multi-surface optical inspector | Steven W. Meeks, Hung Phi Nguyen | 2014-09-09 |
| 8830456 | Optical inspector | Steven W. Meeks, Hung Phi Nguyen | 2014-09-09 |
| 8498184 | Interchangeable disk clamp | Alireza Shahdoostmoghadam, Arthur Kwun, Hung Phi Nguyen, Darren Seawright, Robert Ocheltree +1 more | 2013-07-30 |
| 7656519 | Wafer edge inspection | Steven W. Meeks | 2010-02-02 |
| 7532318 | Wafer edge inspection | Steven W. Meeks, William R. Wheeler, Hung Phi Nguyen, Vamsi Velidandla, Anoop Somanchi +1 more | 2009-05-12 |
| 7161668 | Wafer edge inspection | Steven W. Meeks, William R. Wheeler, Hung Phi Nguyen | 2007-01-09 |
| 7161667 | Wafer edge inspection | Steven W. Meeks, William R. Wheeler, Hung Phi Nguyen | 2007-01-09 |
| 7110097 | Combined high speed optical profilometer and ellipsometer | Steven W. Meeks | 2006-09-19 |