Issued Patents All Time
Showing 26–39 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7075630 | Combined high speed optical profilometer and ellipsometer | Steven W. Meeks | 2006-07-11 |
| 6956660 | System and method for measuring properties of an object using a phase difference between two reflected light signals | Steven W. Meeks | 2005-10-18 |
| 6956658 | System and method for measuring object characteristics using phase differences in polarized light reflections | Steven W. Meeks | 2005-10-18 |
| 6757056 | Combined high speed optical profilometer and ellipsometer | Steven W. Meeks | 2004-06-29 |
| 6717671 | System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern | Steven W. Meeks | 2004-04-06 |
| 6665078 | System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers | Steven W. Meeks | 2003-12-16 |
| 6392749 | High speed optical profilometer for measuring surface height variation | Steven W. Meeks | 2002-05-21 |
| 6268919 | System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations | Steven W. Meeks, Ronny Soetarman | 2001-07-31 |
| 6229610 | System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation | Steven W. Meeks, Ronny Soetarman | 2001-05-08 |
| 6198533 | High temperature thin film property measurement system and method | Steven W. Meeks, Ronny Soetarman | 2001-03-06 |
| 6130749 | System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation | Steven W. Meeks, Ronny Soetarman | 2000-10-10 |
| 6031615 | System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness | Steven W. Meeks, Ronny Soetarman | 2000-02-29 |
| 5705741 | Constant-force profilometer with stylus-stabilizing sensor assembly, dual-view optics, and temperature drift compensation | Steven Eaton, William R. Wheeler | 1998-01-06 |
| 4597708 | Wafer handling apparatus | William R. Wheeler, George Kren, David Clementson | 1986-07-01 |