Candela Instruments — 13 Patents, Ranked #43,904

Patents per Year

Showing 1–4 of 4 inventors

Patent	Est. Value	Year
System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern	$6M	2004
Combined high speed optical profilometer and ellipsometer	$4M	2004
Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks	$4M	2004
Method of detecting and classifying scratches and particles on thin film disks or wafers	$3M	2006
System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers	$3M	2003