Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern

System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern

US Patent 6717671 · Granted Apr 6, 2004

Estimated economic value: $6,326,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

3D microscope including insertable components to provide multiple imaging and me2025
Surface contour measurement2024
Slope, p-component and s-component measurement2024
Scanning micro profiler2024
Angle independent optical surface inspector2024
Region prober optical inspector2024
Time domain multiplexed defect scanner2023
Time domain multiplexed defect scanner2023
3D microscope including insertable components to provide multiple imaging and me2022
3D microscope including insertable components to provide multiple imaging and me2022
Region prober optical inspector2022
3D microscope including insertable components to provide multiple imaging and me2021