Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265212 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2025-04-01 |
| 11536940 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2022-12-27 |
| 11294161 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2022-04-05 |
| 10884228 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2021-01-05 |
| 10769769 | Dual mode inspector | Steven W. Meeks, Rusmin Kudinar, Hung Phi Nguyen, James Jianguo Xu | 2020-09-08 |
| 10359613 | Optical measurement of step size and plated metal thickness | James Jianguo Xu, Budi Hartono | 2019-07-23 |
| 10338009 | Method and apparatus to detect defects in transparent solids | Steven W. Meeks | 2019-07-02 |
| 10209501 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen +1 more | 2019-02-19 |
| 10168524 | Optical measurement of bump hieght | James Jianguo Xu | 2019-01-01 |
| 10157457 | Optical measurement of opening dimensions in a wafer | James Jianguo Xu, Ken Kinsun Lee, Nitigya Kathuria | 2018-12-18 |
| 10094787 | Multi-surface specular reflection inspector | Steven W. Meeks, Rusmin Kudinar, Hung Phi Nguyen | 2018-10-09 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2018-08-14 |
| 9921169 | Method of detecting defect location using multi-surface specular reflection | Steven W. Meeks, Rusmin Kudinar, Hung Phi Nguyen | 2018-03-20 |
| 9784691 | Method and apparatus to optically detect defects in transparent solids | Steven W. Meeks | 2017-10-10 |
| 9389408 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen +1 more | 2016-07-12 |
| 9036869 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Zhen Hou, James Jianguo Xu, Rusmin Kudinar, Vamsi Velidandla +1 more | 2015-05-19 |
| 8976366 | System and method for monitoring LED chip surface roughening process | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Hung Phi Nguyen, Zhen Hou | 2015-03-10 |
| 7630086 | Surface finish roughness measurement | Dave S. Oak, Tri Do, Steven W. Meeks, Vamsi Velidandla | 2009-12-08 |
| 7532318 | Wafer edge inspection | Steven W. Meeks, Rusmin Kudinar, William R. Wheeler, Hung Phi Nguyen, Vamsi Velidandla +1 more | 2009-05-12 |
| 7397621 | Servo pattern characterization on magnetic disks | Zhen Hou, Vamsi Velidandla, Steven W. Meeks | 2008-07-08 |
| 7161669 | Wafer edge inspection | Vamsi Velidandla, Anoop Somanchi, Steven W. Meeks | 2007-01-09 |
| 7075741 | System and method for automatically determining magnetic eccentricity of a disk | Vamsi Velidandla, Jimmy Chun-Chuen Leung, Steven W. Meeks | 2006-07-11 |
| 6268919 | System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations | Steven W. Meeks, Rusmin Kudinar | 2001-07-31 |
| 6229610 | System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation | Steven W. Meeks, Rusmin Kudinar | 2001-05-08 |
| 6198533 | High temperature thin film property measurement system and method | Steven W. Meeks, Rusmin Kudinar | 2001-03-06 |