Issued Patents All Time
Showing 25 most recent of 48 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265212 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2025-04-01 |
| 12146732 | Surface contour measurement | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2024-11-19 |
| 12146830 | Slope, p-component and s-component measurement | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2024-11-19 |
| 12147033 | Scanning micro profiler | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2024-11-19 |
| 12130243 | Angle independent optical surface inspector | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2024-10-29 |
| 11988615 | Region prober optical inspector | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2024-05-21 |
| 11852592 | Time domain multiplexed defect scanner | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2023-12-26 |
| 11733173 | Time domain multiplexed defect scanner | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2023-08-22 |
| 11536940 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2022-12-27 |
| 11294161 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2022-04-05 |
| 11255796 | Region prober optical inspector | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2022-02-22 |
| 10884228 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2021-01-05 |
| 10767977 | Scattered radiation defect depth detection | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2020-09-08 |
| 10769769 | Dual mode inspector | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman, James Jianguo Xu | 2020-09-08 |
| 10648928 | Scattered radiation optical scanner | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2020-05-12 |
| 10641713 | Phase retardance optical scanner | Steven W. Meeks, Alireza Shahdoost Moghaddam | 2020-05-05 |
| 10209501 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Rusmin Kudinar +1 more | 2019-02-19 |
| 10094787 | Multi-surface specular reflection inspector | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman | 2018-10-09 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2018-08-14 |
| 9921169 | Method of detecting defect location using multi-surface specular reflection | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman | 2018-03-20 |
| 9422950 | Floating optical sensor mount | John Hartzell, James Cirillo, Dustin Hromyak, David B. Crowley, Michael A. Laurich | 2016-08-23 |
| 9389408 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Rusmin Kudinar +1 more | 2016-07-12 |
| 9335207 | Optical sensor and mounting interface | David Bina, James Cirillo, Laird Daubenspeck | 2016-05-10 |
| 8976366 | System and method for monitoring LED chip surface roughening process | James Jianguo Xu, Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Zhen Hou | 2015-03-10 |
| 8896825 | Optical inspector | Steven W. Meeks, Rusmin Kudinar | 2014-11-25 |