Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265212 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2025-04-01 |
| 11536940 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2022-12-27 |
| 11294161 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2022-04-05 |
| 10884228 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2021-01-05 |
| 10769769 | Dual mode inspector | Steven W. Meeks, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen | 2020-09-08 |
| 10359613 | Optical measurement of step size and plated metal thickness | Ronny Soetarman, Budi Hartono | 2019-07-23 |
| 10209501 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen, Rusmin Kudinar +1 more | 2019-02-19 |
| 10168524 | Optical measurement of bump hieght | Ronny Soetarman | 2019-01-01 |
| 10157457 | Optical measurement of opening dimensions in a wafer | Ronny Soetarman, Ken Kinsun Lee, Nitigya Kathuria | 2018-12-18 |
| 10048480 | 3D microscope including insertable components to provide multiple imaging and measurement capabilities | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2018-08-14 |
| 9664888 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetaman, Zhen Hou, Rusmin Kudinar, Vamsi Velidandla +1 more | 2017-05-30 |
| 9645381 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetaman, Zhen Hou, Rusmin Kudinar, Vamsi Velidandla +1 more | 2017-05-09 |
| 9389408 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen, Rusmin Kudinar +1 more | 2016-07-12 |
| 9036869 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetarman, Zhen Hou, Rusmin Kudinar, Vamsi Velidandla +1 more | 2015-05-19 |
| 8976366 | System and method for monitoring LED chip surface roughening process | Ken Kinsun Lee, Rusmin Kudinar, Ronny Soetarman, Hung Phi Nguyen, Zhen Hou | 2015-03-10 |
| 8184364 | Illuminator for a 3-D optical microscope | Ken Kinsun Lee | 2012-05-22 |
| 8174762 | 3-D optical microscope | Ken Kinsun Lee | 2012-05-08 |
| 7944609 | 3-D optical microscope | Ken Kinsun Lee | 2011-05-17 |
| 7729049 | 3-d optical microscope | Ken Kinsun Lee | 2010-06-01 |
| 7433031 | Defect review system with 2D scanning and a ring detector | Ken Kinsun Lee | 2008-10-07 |
| 7110106 | Surface inspection system | Ken Kinsun Lee | 2006-09-19 |
| 7043101 | Integrated optical pump module | Yonglin Huang, Jian Lui, Liren Du, Zheng Wang | 2006-05-09 |
| 6069690 | Integrated laser imaging and spectral analysis system | Bruce W. Worster, Ken Kinsun Lee | 2000-05-30 |
| 5912735 | Laser/white light viewing laser imaging system | — | 1999-06-15 |
| 5761336 | Aperture optimization method providing improved defect detection and characterization | John E. Fertig, Ken Kinsun Lee | 1998-06-02 |