Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9664888 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetaman, Zhen Hou, James Jianguo Xu, Rusmin Kudinar +1 more | 2017-05-30 |
| 9645381 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetaman, Zhen Hou, James Jianguo Xu, Rusmin Kudinar +1 more | 2017-05-09 |
| 9036869 | Multi-surface optical 3D microscope | Ken Kinsun Lee, Ronny Soetarman, Zhen Hou, James Jianguo Xu, Rusmin Kudinar +1 more | 2015-05-19 |
| 7630086 | Surface finish roughness measurement | Dave S. Oak, Tri Do, Ronny Soetarman, Steven W. Meeks | 2009-12-08 |
| 7592616 | Detecting micropipes | — | 2009-09-22 |
| 7532318 | Wafer edge inspection | Steven W. Meeks, Rusmin Kudinar, William R. Wheeler, Hung Phi Nguyen, Anoop Somanchi +1 more | 2009-05-12 |
| 7396022 | System and method for optimizing wafer flatness at high rotational speeds | Alireza Shahdoost Moghadam | 2008-07-08 |
| 7397621 | Servo pattern characterization on magnetic disks | Zhen Hou, Ronny Soetarman, Steven W. Meeks | 2008-07-08 |
| 7355711 | Method for detecting an end-point for polishing a material | — | 2008-04-08 |
| 7295300 | Detecting surface pits | Laurie Bechtler, Steven W. Meeks | 2007-11-13 |
| 7201799 | System and method for classifying, detecting, and counting micropipes | — | 2007-04-10 |
| 7161669 | Wafer edge inspection | Anoop Somanchi, Ronny Soetarman, Steven W. Meeks | 2007-01-09 |
| 7075741 | System and method for automatically determining magnetic eccentricity of a disk | Ronny Soetarman, Jimmy Chun-Chuen Leung, Steven W. Meeks | 2006-07-11 |