Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12146732 | Surface contour measurement | Steven W. Meeks, Hung Phi Nguyen | 2024-11-19 |
| 12146830 | Slope, p-component and s-component measurement | Steven W. Meeks, Hung Phi Nguyen | 2024-11-19 |
| 12147033 | Scanning micro profiler | Steven W. Meeks, Hung Phi Nguyen | 2024-11-19 |
| 12130243 | Angle independent optical surface inspector | Steven W. Meeks, Hung Phi Nguyen | 2024-10-29 |
| 11988615 | Region prober optical inspector | Steven W. Meeks, Hung Phi Nguyen | 2024-05-21 |
| 11852592 | Time domain multiplexed defect scanner | Steven W. Meeks, Hung Phi Nguyen | 2023-12-26 |
| 11733173 | Time domain multiplexed defect scanner | Steven W. Meeks, Hung Phi Nguyen | 2023-08-22 |
| 11255796 | Region prober optical inspector | Steven W. Meeks, Hung Phi Nguyen | 2022-02-22 |
| 10767977 | Scattered radiation defect depth detection | Steven W. Meeks, Hung Phi Nguyen | 2020-09-08 |
| 10648928 | Scattered radiation optical scanner | Steven W. Meeks, Hung Phi Nguyen | 2020-05-12 |
| 10641713 | Phase retardance optical scanner | Steven W. Meeks, Hung Phi Nguyen | 2020-05-05 |
| 6882437 | Method of detecting the thickness of thin film disks or wafers | Hung Phi Nguyen | 2005-04-19 |