AJ

Anthony Juliana, Jr.

IBM: 16 patents #6,952 of 70,183Top 10%
📍 San Jose, CA: #4,071 of 32,062 inventorsTop 15%
🗺 California: #37,514 of 386,348 inventorsTop 10%
Overall (All Time): #302,169 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
6704435 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen +2 more 2004-03-09
6624884 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen +2 more 2003-09-23
6117620 Method of producing a calibration disk Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen +1 more 2000-09-12
6100971 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen 2000-08-08
5986761 Laser-based inspection tool for disk defects and curvature Linden James Crawforth, Wayne Isami Imaino, Milton Russell Latta, Hal J. Rosen 1999-11-16
5969370 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen 1999-10-19
5945685 Glass substrate inspection tool having a telecentric lens assembly Wayne Isami Imaino, Milton Russell Latta, Charles Cheng-Hsing Lee, Wai Cheung Leung, Hal J. Rosen 1999-08-31
5933230 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen 1999-08-03
5917589 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen 1999-06-29
5867261 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen 1999-02-02
5847823 Surface inspection tool Wayne Isami Imaino, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen +1 more 1998-12-08
5640381 Laser power-drive circuit having a scaling DAC supplying a scaled reference signal to a plurality of scaled DAC's that supply a plurality of scaled output signals David E. Call, Stephen J. Hrinya, Jerry E. Hurst, Jr., Glen Alan Jaquette 1997-06-17
4873430 Method and apparatus for optically measuring characteristics of a thin film by directing a P-polarized beam through an integrating sphere at the brewster's angle of the film Wai Cheung Leung, Victor Pan, Hal J. Rosen, Timothy Carl Strand 1989-10-10
4645338 Optical system for focus correction for a lithographic tool Milton Russell Latta, Glenn V. Sincerbox, Carlton G. Willson 1987-02-24
4406997 Method and means for minimizing the effect of short circuits in flat panel displays Steven W. Depp 1983-09-27
4266232 Voltage modulated drop-on-demand ink jet method and apparatus Richard W. Koepcke, Ross N. Mills, Frank E. Talke 1981-05-05