Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11047806 | Defect discovery and recipe optimization for inspection of three-dimensional semiconductor structures | Santosh Bhattacharyya, Devashish Sharma, Christopher Maher, Philip Measor, Robert M. Danen | 2021-06-29 |