Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7747062 | Methods, defect review tools, and systems for locating a defect in a defect review process | Da Chen, Christophe David Fouquet, Saibal Banerjee, Santosh Bhattacharyya, Joe Wang +2 more | 2010-06-29 |