Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871395 | Filter assembly for providing adjustable spectral capabilities in a broadband inspection system | Jagadeesh Kumar, David Craig Oram | 2020-12-22 |
| 10785394 | Imaging performance optimization methods for semiconductor wafer inspection | Joshua Knight, Timothy Russin, Vadim Palshin, Suneet Luniya, Kevin Lai +2 more | 2020-09-22 |
| 10599044 | Digital lithography with extended field size | Guoheng Zhao, Christopher Dennis Bencher, Mehdi Vaez-Iravani | 2020-03-24 |
| 10474041 | Digital lithography with extended depth of focus | Guoheng Zhao, Christopher Dennis Bencher, Mehdi Vaez-Iravani | 2019-11-12 |
| 10416087 | Systems and methods for defect detection using image reconstruction | Jing Zhang, Grace Hsiu-Ling Chen, Richard Wallingford | 2019-09-17 |
| 9606069 | Method, apparatus and system for generating multiple spatially separated inspection regions on a substrate | — | 2017-03-28 |