Issued Patents All Time
Showing 26–33 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9092846 | Detecting defects on a wafer using defect-specific and multi-channel information | Lisheng Gao, Grace Hsiu-Ling Chen, David W. Shortt | 2015-07-28 |
| 8989479 | Region based virtual fourier filter | Lisheng Gao, Allen Park, Ellis Chang, Khurram Zafar, Junqing Huang +5 more | 2015-03-24 |
| 8111900 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson, Ariel Tribble +3 more | 2012-02-07 |
| 7729529 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson, Ariel Tribble +3 more | 2010-06-01 |
| 7570800 | Methods and systems for binning defects detected on a specimen | Jason Z. Lin, Xing Chu, Sharon McCauley | 2009-08-04 |
| 7359544 | Automatic supervised classifier setup tool for semiconductor defects | Lisheng Gao, Bo Magluyan, Jianxin Zhang, Kevin Yeung, Tong Huang | 2008-04-15 |
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Maruti Shanbhag, Sandeep Bhagwat, Michal Kowalski, Vivekanand Kini +8 more | 2006-11-28 |
| 6747646 | System and method for fusing three-dimensional shape data on distorted images without correcting for distortion | Andre Gueziec, Alan David Kalvin, Willie Williamson, Jr. | 2004-06-08 |