Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10712289 | Inspection for multiple process steps in a single inspection process | Raghav Babulnath | 2020-07-14 |
| 9922269 | Method and system for iterative defect classification | Sankar Venkataraman, Li He, John R. Jordan, Harsh Sinha | 2018-03-20 |
| 9518934 | Wafer defect discovery | Hong Chen, Kenong Wu, Martin Plihal, Vidur Pandita, Ravikumar Sanapala +4 more | 2016-12-13 |