Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422376 | Imaging reflectometry for inline screening | John Robinson, Stilian Ivanov Pandev, Shifang Li, Mike Von Den Hoff, Justin Lach +5 more | 2025-09-23 |
| 11293970 | Advanced in-line part average testing | David W. Price, Robert J. Rathert, Kara L. Sherman, John Robinson, Mike Von Den Hoff +6 more | 2022-04-05 |
| 10223492 | Based device risk assessment | Allen Park, Youseung Jin, Sungchan Cho | 2019-03-05 |
| 8656323 | Based device risk assessment | Allen Park, Youseung Jin, Sungchan Cho | 2014-02-18 |