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Imaging reflectometry for inline screening |
John Robinson, Stilian Ivanov Pandev, Shifang Li, Mike Von Den Hoff, Justin Lach +5 more |
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| 12332182 |
System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data |
Robert J. Rathert, Chet V. Lenox, Oreste Donzella, Justin Lach, John Robinson |
2025-06-17 |
| 11899065 |
System and method to weight defects with co-located modeled faults |
Robert J. Rathert, Chet V. Lenox, Oreste Donzella |
2024-02-13 |
| 11798827 |
Systems and methods for semiconductor adaptive testing using inline defect part average testing |
Robert J. Rathert, Chet V. Lenox, Oreste Donzella, Kara L. Sherman, John Robinson |
2023-10-24 |
| 11754625 |
System and method for identifying latent reliability defects in semiconductor devices |
Robert J. Rathert, Chet V. Lenox, Robert Cappel, Oreste Donzella, Kara L. Sherman |
2023-09-12 |
| 11656274 |
Systems and methods for evaluating the reliability of semiconductor die packages |
Robert J. Rathert, Chet V. Lenox, Oreste Donzella |
2023-05-23 |
| 11624775 |
Systems and methods for semiconductor defect-guided burn-in and system level tests |
Robert J. Rathert, Chet V. Lenox, Oreste Donzella, John Robinson |
2023-04-11 |
| 11614480 |
System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures |
Robert J. Rathert, Chet V. Lenox, Oreste Donzella, John Robinson |
2023-03-28 |
| 11598055 |
Mobile rubber applicator with wide-area ceramic blanket heater |
— |
2023-03-07 |
| 11535574 |
High energy reduced sensitivity tactical explosives |
Thomas Alexander |
2022-12-27 |
| 11293970 |
Advanced in-line part average testing |
Robert J. Rathert, Kara L. Sherman, John Robinson, Mike Von Den Hoff, Barry Saville +6 more |
2022-04-05 |
| 11066792 |
Asphalt reclaimer with top heating lid |
— |
2021-07-20 |
| 10867877 |
Targeted recall of semiconductor devices based on manufacturing data |
Robert J. Rathert |
2020-12-15 |
| 10761128 |
Methods and systems for inline parts average testing and latent reliability defect detection |
Robert J. Rathert, Robert Cappel, Kara L. Sherman, Douglas Sutherland |
2020-09-01 |
| 6756605 |
Molecular scale electronic devices |
Mark A. Reed, James M. Tour, Jia Chen, Adam M. Rawlett |
2004-06-29 |
| 4449741 |
Waste plumbing installation and fittings therefor |
Robert L. Litvin |
1984-05-22 |