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System and method to weight defects with co-located modeled faults |
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Systems and methods for semiconductor adaptive testing using inline defect part average testing |
David W. Price, Chet V. Lenox, Oreste Donzella, Kara L. Sherman, John Robinson |
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System and method for identifying latent reliability defects in semiconductor devices |
David W. Price, Chet V. Lenox, Robert Cappel, Oreste Donzella, Kara L. Sherman |
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Systems and methods for evaluating the reliability of semiconductor die packages |
David W. Price, Chet V. Lenox, Oreste Donzella |
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Systems and methods for semiconductor defect-guided burn-in and system level tests |
David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson |
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System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures |
David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson |
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Advanced in-line part average testing |
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Targeted recall of semiconductor devices based on manufacturing data |
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Methods and systems for inline parts average testing and latent reliability defect detection |
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2020-09-01 |