Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422376 | Imaging reflectometry for inline screening | John Robinson, Stilian Ivanov Pandev, Shifang Li, Mike Von Den Hoff, Justin Lach +5 more | 2025-09-23 |
| 12332182 | System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data | David W. Price, Chet V. Lenox, Oreste Donzella, Justin Lach, John Robinson | 2025-06-17 |
| 11899065 | System and method to weight defects with co-located modeled faults | David W. Price, Chet V. Lenox, Oreste Donzella | 2024-02-13 |
| 11798827 | Systems and methods for semiconductor adaptive testing using inline defect part average testing | David W. Price, Chet V. Lenox, Oreste Donzella, Kara L. Sherman, John Robinson | 2023-10-24 |
| 11754625 | System and method for identifying latent reliability defects in semiconductor devices | David W. Price, Chet V. Lenox, Robert Cappel, Oreste Donzella, Kara L. Sherman | 2023-09-12 |
| 11656274 | Systems and methods for evaluating the reliability of semiconductor die packages | David W. Price, Chet V. Lenox, Oreste Donzella | 2023-05-23 |
| 11624775 | Systems and methods for semiconductor defect-guided burn-in and system level tests | David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson | 2023-04-11 |
| 11614480 | System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures | David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson | 2023-03-28 |
| 11293970 | Advanced in-line part average testing | David W. Price, Kara L. Sherman, John Robinson, Mike Von Den Hoff, Barry Saville +6 more | 2022-04-05 |
| 10867877 | Targeted recall of semiconductor devices based on manufacturing data | David W. Price | 2020-12-15 |
| 10761128 | Methods and systems for inline parts average testing and latent reliability defect detection | David W. Price, Robert Cappel, Kara L. Sherman, Douglas Sutherland | 2020-09-01 |