Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754625 | System and method for identifying latent reliability defects in semiconductor devices | David W. Price, Robert J. Rathert, Chet V. Lenox, Oreste Donzella, Kara L. Sherman | 2023-09-12 |
| 11293970 | Advanced in-line part average testing | David W. Price, Robert J. Rathert, Kara L. Sherman, John Robinson, Mike Von Den Hoff +6 more | 2022-04-05 |
| 10761128 | Methods and systems for inline parts average testing and latent reliability defect detection | David W. Price, Robert J. Rathert, Kara L. Sherman, Douglas Sutherland | 2020-09-01 |