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Imaging reflectometry for inline screening |
John Robinson, Stilian Ivanov Pandev, Shifang Li, Mike Von Den Hoff, Justin Lach +5 more |
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| 12332182 |
System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data |
David W. Price, Robert J. Rathert, Oreste Donzella, Justin Lach, John Robinson |
2025-06-17 |
| 11899065 |
System and method to weight defects with co-located modeled faults |
David W. Price, Robert J. Rathert, Oreste Donzella |
2024-02-13 |
| 11798827 |
Systems and methods for semiconductor adaptive testing using inline defect part average testing |
Robert J. Rathert, David W. Price, Oreste Donzella, Kara L. Sherman, John Robinson |
2023-10-24 |
| 11754625 |
System and method for identifying latent reliability defects in semiconductor devices |
David W. Price, Robert J. Rathert, Robert Cappel, Oreste Donzella, Kara L. Sherman |
2023-09-12 |
| 11656274 |
Systems and methods for evaluating the reliability of semiconductor die packages |
Robert J. Rathert, David W. Price, Oreste Donzella |
2023-05-23 |
| 11624775 |
Systems and methods for semiconductor defect-guided burn-in and system level tests |
Robert J. Rathert, David W. Price, Oreste Donzella, John Robinson |
2023-04-11 |
| 11614480 |
System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures |
David W. Price, Robert J. Rathert, Oreste Donzella, John Robinson |
2023-03-28 |
| 9768078 |
Inner L-spacer for replacement gate flow |
Seung-Chul Song, Brian K. Kirkpatrick |
2017-09-19 |
| 9362375 |
Inner L-spacer for replacement gate flow |
Seung-Chul Song, Brian K. Kirkpatrick |
2016-06-07 |
| 9178037 |
Inner L-spacer for replacement gate flow |
Seung-Chul Song, Brian K. Kirkpatrick |
2015-11-03 |
| 9087917 |
Inner L-spacer for replacement gate flow |
Seung-Chul Song, Brian K. Kirkpatrick |
2015-07-21 |
| 8828833 |
System for controlling SiGe-to-gate spacing |
James Walter Blatchford |
2014-09-09 |