Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11047795 | Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems | Kazuki Negishi, Michael E. Simmons, Joseph George Frankel, Eric Robert Christenson, Mario Berg | 2021-06-29 |
| 10698002 | Probe systems for testing a device under test | Michael E. Simmons, Bryan Bolt, Gavin Neil Fisher, Anthony Lord, Kazuki Negishi | 2020-06-30 |
| 10060950 | Shielded probe systems | Michael E. Simmons, Bryan Bolt, Kazuki Negishi, Joseph George Frankel, Robbie Ingram-Goble | 2018-08-28 |
| 9991152 | Wafer-handling end effectors with wafer-contacting surfaces and sealing structures | Robbie Ingram-Goble, Michael E. Simmons, Philip Wolf, Ryan Garrison | 2018-06-05 |
| 8167648 | Low noise connector with cables having a center, middle and outer conductors | Kazuki Negishi, Michael E. Simmons, ToeNaing Swe | 2012-05-01 |