Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11874301 | Probe systems including imaging devices with objective lens isolators, and related methods | Yu-Wen Huang, Gerald Lee Gisler, Eric Robert Christenson, Michael E. Simmons | 2024-01-16 |
| 11346883 | Probe systems and methods for testing a device under test | — | 2022-05-31 |
| 11313936 | Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure | Joseph George Frankel | 2022-04-26 |
| 11181550 | Probe systems and methods including electric contact detection | Sia Choon Beng | 2021-11-23 |
| 11131709 | Probe systems for optically probing a device under test and methods of operating the probe systems | Joseph George Frankel, Michael E. Simmons, Eric Robert Christenson, Daniel Rishavy | 2021-09-28 |
| 11047795 | Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems | Michael E. Simmons, Christopher Storm, Joseph George Frankel, Eric Robert Christenson, Mario Berg | 2021-06-29 |
| 10877070 | Probes with fiducial targets, probe systems including the same, and associated methods | Joseph George Frankel, Koby L. Duckworth | 2020-12-29 |
| 10809048 | Probe systems and methods for calibrating capacitive height sensing measurements | Joseph George Frankel, Eric Robert Christenson | 2020-10-20 |
| 10698002 | Probe systems for testing a device under test | Christopher Storm, Michael E. Simmons, Bryan Bolt, Gavin Neil Fisher, Anthony Lord | 2020-06-30 |
| 10330703 | Probe systems and methods including electric contact detection | Sia Choon Beng | 2019-06-25 |
| 10281518 | Systems and methods for on-wafer dynamic testing of electronic devices | Eric Lyell Hill | 2019-05-07 |
| 10060950 | Shielded probe systems | Michael E. Simmons, Bryan Bolt, Christopher Storm, Joseph George Frankel, Robbie Ingram-Goble | 2018-08-28 |
| 10062597 | High voltage chuck for a probe station | Michael E. Simmons, Ryan Garrison, Philip Wolf | 2018-08-28 |
| 9741599 | High voltage chuck for a probe station | Michael E. Simmons, Ryan Garrison, Philip Wolf | 2017-08-22 |
| 9506973 | High voltage chuck for a probe station | Michael E. Simmons, Roy Jensen, Ryan Garrison, Philip Wolf | 2016-11-29 |
| 8823406 | Systems and methods for simultaneous optical testing of a plurality of devices under test | Bryan Bolt, Eric W. Strid, Steve Harris | 2014-09-02 |
| 8319503 | Test apparatus for measuring a characteristic of a device under test | Mark D. Hansen | 2012-11-27 |
| 8167648 | Low noise connector with cables having a center, middle and outer conductors | Michael E. Simmons, Christopher Storm, ToeNaing Swe | 2012-05-01 |