Issued Patents All Time
Showing 25 most recent of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9874585 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | Kenneth R. Smith, Mike Jolley, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth | 2018-01-23 |
| 9372214 | High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same | Richard Campbell, Kenneth R. Smith, K. Reed Gleason, Kooho Jung | 2016-06-21 |
| 9099449 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | Kenneth R. Smith, Mike Jolley, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth | 2015-08-04 |
| 8970240 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | Kenneth R. Smith, Mike Jolley, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth | 2015-03-03 |
| 8823406 | Systems and methods for simultaneous optical testing of a plurality of devices under test | Bryan Bolt, Kazuki Negishi, Steve Harris | 2014-09-02 |
| 7764072 | Differential signal probing system | Richard Campbell | 2010-07-27 |
| 7759953 | Active wafer probe | K. Reed Gleason | 2010-07-20 |
| 7723999 | Calibration structures for differential signal probing | Richard Campbell | 2010-05-25 |
| 7609077 | Differential signal probe with integral balun | Richard Campbell, Mike Andrews | 2009-10-27 |
| 7518387 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2009-04-14 |
| 7489149 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2009-02-10 |
| 7482823 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2009-01-27 |
| 7443186 | On-wafer test structures for differential signals | Richard Campbell | 2008-10-28 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2008-10-14 |
| 7427868 | Active wafer probe | K. Reed Gleason | 2008-09-23 |
| 7321233 | System for evaluating probing networks | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 2008-01-22 |
| 7304488 | Shielded probe for high-frequency testing of a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2007-12-04 |
| 7164279 | System for evaluating probing networks | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 2007-01-16 |
| 7161363 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2007-01-09 |
| 6987398 | System for evaluating probing networks | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 2006-01-17 |
| 6815963 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more | 2004-11-09 |
| 6803779 | Interconnect assembly for use in evaluating probing networks | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 2004-10-12 |
| 6608496 | Reference transmission line junction for probing device | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 2003-08-19 |
| 6130544 | System for evaluating probing networks | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 2000-10-10 |
| 5973505 | System for evaluating probing networks | Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason | 1999-10-26 |