| 9874585 |
Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same |
Kenneth R. Smith, Mike Jolley, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth |
2018-01-23 |
|
| 9372214 |
High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same |
Richard Campbell, Kenneth R. Smith, K. Reed Gleason, Kooho Jung |
2016-06-21 |
$1,812,000 |
| 9099449 |
Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same |
Kenneth R. Smith, Mike Jolley, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth |
2015-08-04 |
$1,813,000 |
| 8970240 |
Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same |
Kenneth R. Smith, Mike Jolley, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth |
2015-03-03 |
$1,658,000 |
| 8823406 |
Systems and methods for simultaneous optical testing of a plurality of devices under test |
Bryan Bolt, Kazuki Negishi, Steve Harris |
2014-09-02 |
$1,383,000 |
| 7764072 |
Differential signal probing system |
Richard Campbell |
2010-07-27 |
$264,000 |
| 7759953 |
Active wafer probe |
K. Reed Gleason |
2010-07-20 |
$751,000 |
| 7723999 |
Calibration structures for differential signal probing |
Richard Campbell |
2010-05-25 |
$1,048,000 |
| 7609077 |
Differential signal probe with integral balun |
Richard Campbell, Mike Andrews |
2009-10-27 |
$1,947,000 |
| 7518387 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2009-04-14 |
$598,000 |
| 7489149 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2009-02-10 |
$943,000 |
| 7482823 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2009-01-27 |
$931,000 |
| 7443186 |
On-wafer test structures for differential signals |
Richard Campbell |
2008-10-28 |
$662,000 |
| 7436194 |
Shielded probe with low contact resistance for testing a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2008-10-14 |
$338,000 |
| 7427868 |
Active wafer probe |
K. Reed Gleason |
2008-09-23 |
$709,000 |
| 7321233 |
System for evaluating probing networks |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
2008-01-22 |
$884,000 |
| 7304488 |
Shielded probe for high-frequency testing of a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2007-12-04 |
$798,000 |
| 7164279 |
System for evaluating probing networks |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
2007-01-16 |
$1,003,000 |
| 7161363 |
Probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2007-01-09 |
$994,000 |
| 6987398 |
System for evaluating probing networks |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
2006-01-17 |
$1,693,000 |
| 6815963 |
Probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin, John Dunklee +2 more |
2004-11-09 |
|
| 6803779 |
Interconnect assembly for use in evaluating probing networks |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
2004-10-12 |
|
| 6608496 |
Reference transmission line junction for probing device |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
2003-08-19 |
|
| 6130544 |
System for evaluating probing networks |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
2000-10-10 |
|
| 5973505 |
System for evaluating probing networks |
Jerry B. Schappacher, Dale E. Carlton, K. Reed Gleason |
1999-10-26 |
|