KS

Kenneth R. Smith

CM Cascade Microtech: 47 patents #1 of 118Top 1%
GE Geometrics: 7 patents #1 of 14Top 8%
Tektronix: 3 patents #378 of 1,698Top 25%
BG Bicc-Vero Electronics Gmbh: 1 patents #2 of 5Top 40%
FB Formfactor Beaverton: 1 patents #11 of 39Top 30%
UA US Army: 1 patents #2,720 of 6,974Top 40%
Overall (All Time): #34,880 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 25 most recent of 64 patents

Patent #TitleCo-InventorsDate
10267848 Method of electrically contacting a bond pad of a device under test with a probe 2019-04-23
9874585 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Mike Jolley, Eric W. Strid, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth 2018-01-23
9726626 Quantum mechanical measurement device Krzysztof Kiersnowski 2017-08-08
9726733 Optical magnetometers Krzysztof Kiersnowski 2017-08-08
9470753 Systems and methods for testing electronic devices that include low power output drivers Daniel Bock 2016-10-18
9429638 Method of replacing an existing contact of a wafer probing assembly 2016-08-30
9372214 High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same Eric W. Strid, Richard Campbell, K. Reed Gleason, Kooho Jung 2016-06-21
9099449 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Mike Jolley, Eric W. Strid, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth 2015-08-04
8970240 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Mike Jolley, Eric W. Strid, Peter Hanaway, K. Reed Gleason, Koby L. Duckworth 2015-03-03
8451017 Membrane probing method using improved contact K. Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2013-05-28
8410806 Replaceable coupon for a probing apparatus 2013-04-02
7893704 Membrane probing structure with laterally scrubbing contacts K. Reed Gleason, Mike Bayne 2011-02-22
7888957 Probing apparatus with impedance optimized interface Roger Hayward 2011-02-15
7761986 Membrane probing method using improved contact Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2010-07-27
7723985 Altered sweep bell-bloom magnetometer 2010-05-25
7681312 Membrane probing system Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2010-03-23
7589518 Wafer probe station having a skirting component Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2009-09-15
7550983 Membrane probing system with local contact scrub K. Reed Gleason, Mike Bayne 2009-06-23
7541821 Membrane probing system with local contact scrub K. Reed Gleason, Mike Bayne 2009-06-02
7533462 Method of constructing a membrane probe Reed Gleason, Michael A. Bayne 2009-05-19
7514944 Probe head having a membrane suspended probe Michael Jolley, Victoria Van Syckel 2009-04-07
7492147 Wafer probe station having a skirting component Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2009-02-17
7492175 Membrane probing system Reed Gleason 2009-02-17
7403025 Membrane probing system Paul A. Tervo, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy 2008-07-22
7400155 Membrane probing system Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2008-07-15