Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8451017 | Membrane probing method using improved contact | K. Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2013-05-28 |
| 7761986 | Membrane probing method using improved contact | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2010-07-27 |
| 7681312 | Membrane probing system | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2010-03-23 |
| 7595632 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2009-09-29 |
| 7403025 | Membrane probing system | Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais | 2008-07-22 |
| 7400155 | Membrane probing system | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2008-07-15 |
| 7348787 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2008-03-25 |
| 7266889 | Membrane probing system | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2007-09-11 |
| 7148711 | Membrane probing system | Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais | 2006-12-12 |
| 7009383 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2006-03-07 |
| 6930498 | Membrane probing system | Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais | 2005-08-16 |
| 6860009 | Probe construction using a recess | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2005-03-01 |
| 6838890 | Membrane probing system | Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais | 2005-01-04 |
| 6825677 | Membrane probing system | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2004-11-30 |
| 6801047 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2004-10-05 |
| 6708386 | Method for probing an electrical device having a layer of oxide thereon | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2004-03-23 |
| 6636059 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2003-10-21 |
| 6486687 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2002-11-26 |
| 6380751 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2002-04-30 |
| 6313649 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 2001-11-06 |
| 6256882 | Membrane probing system | Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher | 2001-07-10 |
| 5604444 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 1997-02-18 |
| 5532609 | Wafer probe station having environment control enclosure | Warren K. Harwood, Paul A. Tervo | 1996-07-02 |
| 5266889 | Wafer probe station with integrated environment control enclosure | Warren K. Harwood, Paul A. Tervo | 1993-11-30 |