MK

Martin Koxxy

CM Cascade Microtech: 24 patents #9 of 118Top 8%
Overall (All Time): #174,940 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8451017 Membrane probing method using improved contact K. Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2013-05-28
7761986 Membrane probing method using improved contact Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2010-07-27
7681312 Membrane probing system Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2010-03-23
7595632 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2009-09-29
7403025 Membrane probing system Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais 2008-07-22
7400155 Membrane probing system Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2008-07-15
7348787 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2008-03-25
7266889 Membrane probing system Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2007-09-11
7148711 Membrane probing system Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais 2006-12-12
7009383 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2006-03-07
6930498 Membrane probing system Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais 2005-08-16
6860009 Probe construction using a recess Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2005-03-01
6838890 Membrane probing system Paul A. Tervo, Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais 2005-01-04
6825677 Membrane probing system Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2004-11-30
6801047 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2004-10-05
6708386 Method for probing an electrical device having a layer of oxide thereon Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2004-03-23
6636059 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2003-10-21
6486687 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2002-11-26
6380751 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2002-04-30
6313649 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 2001-11-06
6256882 Membrane probing system Reed Gleason, Michael A. Bayne, Kenneth R. Smith, Timothy Lesher 2001-07-10
5604444 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 1997-02-18
5532609 Wafer probe station having environment control enclosure Warren K. Harwood, Paul A. Tervo 1996-07-02
5266889 Wafer probe station with integrated environment control enclosure Warren K. Harwood, Paul A. Tervo 1993-11-30