Issued Patents All Time
Showing 25 most recent of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7616017 | Probe station thermal chuck with shielding for capacitive current | Clarence E. Cowan, John Dunklee | 2009-11-10 |
| 7595632 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2009-09-29 |
| 7589518 | Wafer probe station having a skirting component | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2009-09-15 |
| 7492147 | Wafer probe station having a skirting component | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2009-02-17 |
| 7403025 | Membrane probing system | Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy | 2008-07-22 |
| 7348787 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2008-03-25 |
| 7330023 | Wafer probe station having a skirting component | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2008-02-12 |
| 7323895 | Low-current pogo probe card | Clarence E. Cowan | 2008-01-29 |
| 7292057 | Probe station thermal chuck with shielding for capacitive current | Clarence E. Cowan, John Dunklee | 2007-11-06 |
| 7148711 | Membrane probing system | Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy | 2006-12-12 |
| 7148714 | POGO probe card for low current measurements | Clarence E. Cowan | 2006-12-12 |
| 7138813 | Probe station thermal chuck with shielding for capacitive current | Clarence E. Cowan, John Dunklee | 2006-11-21 |
| 7068057 | Low-current pogo probe card | Clarence E. Cowan | 2006-06-27 |
| 7042241 | Low-current pogo probe card | Clarence E. Cowan | 2006-05-09 |
| 7009383 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2006-03-07 |
| 6980012 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2005-12-27 |
| 6930498 | Membrane probing system | Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy | 2005-08-16 |
| 6856153 | Low-current pogo probe card | Clarence E. Cowan | 2005-02-15 |
| 6838890 | Membrane probing system | Kenneth R. Smith, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy | 2005-01-04 |
| 6822467 | Low-current pogo probe card | Clarence E. Cowan | 2004-11-23 |
| 6801047 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2004-10-05 |
| 6720782 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2004-04-13 |
| 6642732 | Probe station thermal chuck with shielding for capacitive current | Clarence E. Cowan, John Dunklee | 2003-11-04 |
| 6636059 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2003-10-21 |
| 6559668 | Low-current pogo probe card | Clarence E. Cowan | 2003-05-06 |