Randy Schwindt — 29 Patents at Cascade Microtech

Randy Schwindt has been granted 29 US patents while listed as an inventor at Cascade Microtech. The first was granted in 1994 and the most recent in September 2009. Randy Schwindt ranks #127,851 of 4,157,543 US inventors in our database (top 3.1%). Patent records list Randy Schwindt in Portland, OR, US.

Issued Patents All Time

Showing 1–25 of 29 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7589518	Wafer probe station having a skirting component	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2009-09-15	$1,961,000
7504842	Probe holder for testing of a test device	—	2009-03-17	$386,000
7492147	Wafer probe station having a skirting component	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2009-02-17	$287,000
7330023	Wafer probe station having a skirting component	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2008-02-12	$417,000
7221174	Probe holder for testing of a test device	—	2007-05-22	$280,000
7071718	Low-current probe card	—	2006-07-04
7057407	Probe holder for testing of a test device	—	2006-06-06	$1,183,000
6995579	Low-current probe card	—	2006-02-07	$1,745,000
6980012	Wafer probe station for low-current measurements	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2005-12-27	$1,602,000
6850082	Probe holder for testing of a test device	—	2005-02-01
6781396	Low-current probe card	—	2004-08-24
6720782	Wafer probe station for low-current measurements	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2004-04-13
6507208	Low-current probe card	—	2003-01-14
6496024	Probe holder for testing of a test device	—	2002-12-17
6492822	Wafer probe station for low-current measurements	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2002-12-10
6384615	Probe holder for low current measurements	—	2002-05-07
6335628	Wafer probe station for low-current measurements	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2002-01-01
6249133	Low-current probe card	—	2001-06-19
6232788	Wafer probe station for low-current measurements	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	2001-05-15
6232789	Probe holder for low current measurements	—	2001-05-15
6137302	Low-current probe card with reduced triboelectric current generating cables	—	2000-10-24
6075376	Low-current probe card	—	2000-06-13
6031383	Probe station for low current, low voltage parametric measurements using multiple probes	George Streib	2000-02-29
5729150	Low-current probe card with reduced triboelectric current generating cables	—	1998-03-17
5663653	Wafer probe station for low-current measurements	Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner	1997-09-02

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Randy Schwindt — 29 Patents

Issued Patents All Time

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