Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7589518 | Wafer probe station having a skirting component | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2009-09-15 |
| 7504842 | Probe holder for testing of a test device | — | 2009-03-17 |
| 7492147 | Wafer probe station having a skirting component | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2009-02-17 |
| 7330023 | Wafer probe station having a skirting component | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2008-02-12 |
| 7221174 | Probe holder for testing of a test device | — | 2007-05-22 |
| 7071718 | Low-current probe card | — | 2006-07-04 |
| 7057407 | Probe holder for testing of a test device | — | 2006-06-06 |
| 6995579 | Low-current probe card | — | 2006-02-07 |
| 6980012 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2005-12-27 |
| 6850082 | Probe holder for testing of a test device | — | 2005-02-01 |
| 6781396 | Low-current probe card | — | 2004-08-24 |
| 6720782 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2004-04-13 |
| 6507208 | Low-current probe card | — | 2003-01-14 |
| 6496024 | Probe holder for testing of a test device | — | 2002-12-17 |
| 6492822 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2002-12-10 |
| 6384615 | Probe holder for low current measurements | — | 2002-05-07 |
| 6335628 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2002-01-01 |
| 6249133 | Low-current probe card | — | 2001-06-19 |
| 6232789 | Probe holder for low current measurements | — | 2001-05-15 |
| 6232788 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2001-05-15 |
| 6137302 | Low-current probe card with reduced triboelectric current generating cables | — | 2000-10-24 |
| 6075376 | Low-current probe card | — | 2000-06-13 |
| 6031383 | Probe station for low current, low voltage parametric measurements using multiple probes | George Streib | 2000-02-29 |
| 5729150 | Low-current probe card with reduced triboelectric current generating cables | — | 1998-03-17 |
| 5663653 | Wafer probe station for low-current measurements | Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 1997-09-02 |