Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11225091 | Print media pressure plates | Peter J Boucher, Jason Carothers, Luke P. Sosnowski | 2022-01-18 |
| 7595632 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2009-09-29 |
| 7589518 | Wafer probe station having a skirting component | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2009-09-15 |
| 7492147 | Wafer probe station having a skirting component | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2009-02-17 |
| 7348787 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2008-03-25 |
| 7330023 | Wafer probe station having a skirting component | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2008-02-12 |
| 7009383 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2006-03-07 |
| 6980012 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2005-12-27 |
| 6801047 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2004-10-05 |
| 6720782 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2004-04-13 |
| 6636059 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2003-10-21 |
| 6492822 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2002-12-10 |
| 6486687 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2002-11-26 |
| 6380751 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2002-04-30 |
| 6335628 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2002-01-01 |
| 6313649 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 2001-11-06 |
| 6232788 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 2001-05-15 |
| 5663653 | Wafer probe station for low-current measurements | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 1997-09-02 |
| 5604444 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 1997-02-18 |
| 5532609 | Wafer probe station having environment control enclosure | Paul A. Tervo, Martin Koxxy | 1996-07-02 |
| 5457398 | Wafer probe station having full guarding | Randy Schwindt, Paul A. Tervo | 1995-10-10 |
| 5434512 | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner, Peter Andrews | 1995-07-18 |
| 5345170 | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Randy Schwindt, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner, Peter Andrews | 1994-09-06 |
| 5266889 | Wafer probe station with integrated environment control enclosure | Martin Koxxy, Paul A. Tervo | 1993-11-30 |
| 5237267 | Wafer probe station having auxiliary chucks | Paul A. Tervo, Richard H. Warner | 1993-08-17 |