Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379395 | Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test | Choon-Beng Sia, Yoichi Funatoko, Isao Kunioka, Masanori Watanabe, Ken Dawson | 2025-08-05 |
| 10365323 | Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change | David Newton, David Hess | 2019-07-30 |
| 9435858 | Focusing optical systems and methods for testing semiconductors | David Hess | 2016-09-06 |
| 7940069 | System for testing semiconductors | David Hess | 2011-05-10 |
| 7898281 | Interface for testing semiconductors | David Hess, Robert New | 2011-03-01 |
| 7688091 | Chuck with integrated wafer support | Brad Froemke, John Dunklee | 2010-03-30 |
| 7656172 | System for testing semiconductors | David Hess | 2010-02-02 |
| 7535247 | Interface for testing semiconductors | David Hess, Robert New | 2009-05-19 |
| 7362115 | Chuck with integrated wafer support | Brad Froemke, John Dunklee | 2008-04-22 |
| 7187188 | Chuck with integrated wafer support | Brad Froemke, John Dunklee | 2007-03-06 |
| 5434512 | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 1995-07-18 |
| 5345170 | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner | 1994-09-06 |