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Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test |
Choon-Beng Sia, Yoichi Funatoko, Isao Kunioka, Masanori Watanabe, Ken Dawson |
2025-08-05 |
| 10365323 |
Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change |
David Newton, David Hess |
2019-07-30 |
| 9435858 |
Focusing optical systems and methods for testing semiconductors |
David Hess |
2016-09-06 |
| 7940069 |
System for testing semiconductors |
David Hess |
2011-05-10 |
| 7898281 |
Interface for testing semiconductors |
David Hess, Robert New |
2011-03-01 |
| 7688091 |
Chuck with integrated wafer support |
Brad Froemke, John Dunklee |
2010-03-30 |
| 7656172 |
System for testing semiconductors |
David Hess |
2010-02-02 |
| 7535247 |
Interface for testing semiconductors |
David Hess, Robert New |
2009-05-19 |
| 7362115 |
Chuck with integrated wafer support |
Brad Froemke, John Dunklee |
2008-04-22 |
| 7187188 |
Chuck with integrated wafer support |
Brad Froemke, John Dunklee |
2007-03-06 |
| 5434512 |
Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner |
1995-07-18 |
| 5345170 |
Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner |
1994-09-06 |