Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Peter Andrews — 12 Patents

CMCascade Microtech: 10 patents #23 of 118Top 20%
FOFormfactor: 1 patents #105 of 177Top 60%
FBFormfactor Beaverton: 1 patents #11 of 39Top 30%
Beaverton, OR: #504 of 3,140 inventorsTop 20%
Oregon: #3,634 of 28,073 inventorsTop 15%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Peter Andrews has been granted 12 US patents while listed as an inventor at Cascade Microtech. The first was granted in 1994 and the most recent in August 2025. Peter Andrews ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Peter Andrews in Beaverton, OR, US.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12379395 Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test Choon-Beng Sia, Yoichi Funatoko, Isao Kunioka, Masanori Watanabe, Ken Dawson 2025-08-05
10365323 Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change David Newton, David Hess 2019-07-30
9435858 Focusing optical systems and methods for testing semiconductors David Hess 2016-09-06
7940069 System for testing semiconductors David Hess 2011-05-10 $1,132,000
7898281 Interface for testing semiconductors David Hess, Robert New 2011-03-01 $604,000
7688091 Chuck with integrated wafer support Brad Froemke, John Dunklee 2010-03-30 $324,000
7656172 System for testing semiconductors David Hess 2010-02-02 $1,187,000
7535247 Interface for testing semiconductors David Hess, Robert New 2009-05-19 $520,000
7362115 Chuck with integrated wafer support Brad Froemke, John Dunklee 2008-04-22 $937,000
7187188 Chuck with integrated wafer support Brad Froemke, John Dunklee 2007-03-06 $945,000
5434512 Wafer probe station having integrated guarding, Kelvin connection and shielding systems Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner 1995-07-18
5345170 Wafer probe station having integrated guarding, Kelvin connection and shielding systems Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Kenneth R. Smith, Richard H. Warner 1994-09-06