Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System for testing semiconductors

System for testing semiconductors

US Patent 7656172 · Granted Feb 2, 2010

Estimated economic value: $1,187,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probes, probe blades, tools for probe blades, blade holders, and probe systems f2025
Methods of producing augmented probe system images and associated probe systems2023
Methods of controlling the operation of probe stations and probe stations that p2021
Probe systems and methods for automatically maintaining alignment between a prob2019
Probe systems and methods for automatically maintaining alignment between a prob2019
Focusing optical systems and methods for testing semiconductors2016
Focusing optical systems and methods for testing semiconductors2016
System for testing semiconductors2011
System for testing semiconductors2011
Interface for testing semiconductors2011
Interface for testing semiconductors2011
Chuck with integrated wafer support2010