| 11313902 |
Modular rail systems, rail systems, mechanisms, and equipment for devices under test |
William A. Funk, Bryan J. Root |
2022-04-26 |
|
| 10620262 |
Modular rail systems, rail systems, mechanisms, and equipment for devices under test |
William A. Funk, Bryan J. Root |
2020-04-14 |
|
| 10295565 |
Probe card with stress relieving feature |
William A. Funk |
2019-05-21 |
|
| 10261124 |
Modular rail systems, rail systems, mechanisms, and equipment for devices under test |
William A. Funk, Bryan J. Root |
2019-04-16 |
|
| 10254309 |
Test apparatus having a probe core with a latch mechanism |
William A. Funk, Bryan J. Root |
2019-04-09 |
|
| 10145863 |
Test systems with a probe apparatus and index mechanism |
William A. Funk, Bryan J. Root |
2018-12-04 |
|
| 9726694 |
Test systems with a probe apparatus and index mechanism |
William A. Funk, Bryan J. Root |
2017-08-08 |
$3,420,000 |
| 9024651 |
Test apparatus having a probe card and connector mechanism |
Bryan J. Root, William A. Funk, Michael Palumbo |
2015-05-05 |
|
| 9018966 |
Test apparatus having a probe card and connector mechanism |
Bryan J. Root, William A. Funk |
2015-04-28 |
$4,213,000 |
| 8994390 |
Test systems with a probe apparatus and index mechanism |
Bryan J. Root, William A. Funk |
2015-03-31 |
$4,262,000 |
| D722031 |
Top contact layout board in an electrical system |
William A. Funk, Matthew Page, Dennis Flanders, Bryan J. Root |
2015-02-03 |
|
| D713363 |
Support for a probe test core |
William A. Funk, Dennis Flanders, Bryan J. Root |
2014-09-16 |
|
| 7969173 |
Chuck for holding a device under test |
— |
2011-06-28 |
$1,015,000 |
| 7876115 |
Chuck for holding a device under test |
Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann +3 more |
2011-01-25 |
$630,000 |
| 7688062 |
Probe station |
Greg Nordgren |
2010-03-30 |
$324,000 |
| 7688091 |
Chuck with integrated wafer support |
Peter Andrews, Brad Froemke |
2010-03-30 |
$324,000 |
| 7639003 |
Guarded tub enclosure |
Greg Norgden, C. Eugene Cowan |
2009-12-29 |
$1,478,000 |
| 7618590 |
Fluid dispensing system |
K. Reed Gleason, Peter Navratil, John Martin, Cali Sartor, Thane Allison |
2009-11-17 |
$848,000 |
| 7616017 |
Probe station thermal chuck with shielding for capacitive current |
Clarence E. Cowan, Paul A. Tervo |
2009-11-10 |
$1,808,000 |
| 7554322 |
Probe station |
Greg Nordgren |
2009-06-30 |
$1,585,000 |
| 7518358 |
Chuck for holding a device under test |
— |
2009-04-14 |
$598,000 |
| 7518387 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more |
2009-04-14 |
$598,000 |
| 7514915 |
Chuck for holding a device under test |
— |
2009-04-07 |
$539,000 |
| 7501810 |
Chuck for holding a device under test |
— |
2009-03-10 |
$342,000 |
| 7498828 |
Probe station with low inductance path |
Clarence E. Cowan |
2009-03-03 |
$402,000 |
