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Bryan J. Root — 44 Patents

CSCeladon Systems: 43 patents #1 of 9Top 15%
Xerox: 1 patents #5,237 of 8,622Top 65%
Intel: 1 patents #18,326 of 30,777Top 60%
Apple Valley, MN: #12 of 500 inventorsTop 3%
Minnesota: #1,110 of 52,454 inventorsTop 3%
Overall (All Time): #66,838 of 4,157,543Top 2%
44 Patents All Time
Bryan J. Root has been granted 44 US patents while listed as an inventor at Celadon Systems. The first was granted in 2001 and the most recent in April 2022. Bryan J. Root ranks #66,838 of 4,157,543 US inventors in our database (top 1.6%). Patent records list Bryan J. Root in Apple Valley, MN, US.

Issued Patents All Time

Showing 1–25 of 44 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11313902 Modular rail systems, rail systems, mechanisms, and equipment for devices under test John Dunklee, William A. Funk 2022-04-26
11275106 High voltage probe card system Adam Schultz, William A. Funk 2022-03-15
10976347 Magnet extension William A. Funk 2021-04-13
10620262 Modular rail systems, rail systems, mechanisms, and equipment for devices under test John Dunklee, William A. Funk 2020-04-14
10261124 Modular rail systems, rail systems, mechanisms, and equipment for devices under test John Dunklee, William A. Funk 2019-04-16
10254309 Test apparatus having a probe core with a latch mechanism John Dunklee, William A. Funk 2019-04-09
10145863 Test systems with a probe apparatus and index mechanism William A. Funk, John Dunklee 2018-12-04
9910067 Apparatus and method for terminating probe apparatus of semiconductor wafer William A. Funk 2018-03-06 $3,114,000
9726694 Test systems with a probe apparatus and index mechanism William A. Funk, John Dunklee 2017-08-08 $3,420,000
9678149 Test apparatus having a probe core with a twist lock mechanism William A. Funk 2017-06-13 $1,643,000
9279829 Apparatus and method for terminating probe apparatus of semiconductor wafer William A. Funk 2016-03-08 $2,656,000
9024651 Test apparatus having a probe card and connector mechanism William A. Funk, Michael Palumbo, John Dunklee 2015-05-05
9018966 Test apparatus having a probe card and connector mechanism William A. Funk, John Dunklee 2015-04-28 $4,213,000
8994390 Test systems with a probe apparatus and index mechanism William A. Funk, John Dunklee 2015-03-31 $4,262,000
D722031 Top contact layout board in an electrical system John Dunklee, William A. Funk, Matthew Page, Dennis Flanders 2015-02-03
8860450 Apparatus and method for terminating probe apparatus of semiconductor wafer William A. Funk 2014-10-14 $2,838,000
D713363 Support for a probe test core William A. Funk, Dennis Flanders, John Dunklee 2014-09-16
8698515 Probe test equipment for testing a semiconductor device William A. Funk 2014-04-15 $3,550,000
8674715 Test apparatus having a probe core with a twist lock mechanism William A. Funk 2014-03-18 $3,553,000
8354856 Replaceable probe apparatus for probing semiconductor wafer William A. Funk 2013-01-15 $3,703,000
8149009 Apparatus and method for terminating probe apparatus of semiconductor wafer William A. Funk 2012-04-03 $2,967,000
D654033 Grooved wire support for a probe test core William A. Funk 2012-02-14
8082842 Perfluorinated polyether release agent for phase change ink members David J. Gervasi, Santokh S. Badesha 2011-12-27 $1,338,000
7999564 Replaceable probe apparatus for probing semiconductor wafer William A. Funk 2011-08-16 $1,956,000
D639755 Top contact layout board in an electrical system William A. Funk 2011-06-14

Nearby-Ranked Inventors

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Gary Sprague44
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Cris Braun44
Jean-Claude Yvin44
Vikas Sinha44
Ning Ding44
David Todd44
Kevin Lomeli44