Issued Patents All Time
Showing 26–44 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D639757 | Top contact layout board in an electrical system | William A. Funk | 2011-06-14 |
| 7956629 | Probe tile for probing semiconductor wafer | — | 2011-06-07 |
| 7786743 | Probe tile for probing semiconductor wafer | — | 2010-08-31 |
| 7768282 | Apparatus and method for terminating probe apparatus of semiconductor wafer | William A. Funk | 2010-08-03 |
| 7728609 | Replaceable probe apparatus for probing semiconductor wafer | William A. Funk | 2010-06-01 |
| 7659737 | Electrical, high temperature test probe with conductive driven guard | William A. Funk | 2010-02-09 |
| 7626404 | Replaceable probe apparatus for probing semiconductor wafer | William A. Funk | 2009-12-01 |
| 7545157 | Shielded probe apparatus for probing semiconductor wafer | William A. Funk | 2009-06-09 |
| 7345494 | Probe tile for probing semiconductor wafer | — | 2008-03-18 |
| 7271607 | Electrical, high temperature test probe with conductive driven guard | William A. Funk | 2007-09-18 |
| 7259577 | Shielded probe apparatus for probing semiconductor wafer | William A. Funk | 2007-08-21 |
| 7170305 | Apparatus and method for terminating probe apparatus of semiconductor wafer | William A. Funk | 2007-01-30 |
| 7148710 | Probe tile for probing semiconductor wafer | — | 2006-12-12 |
| 6992495 | Shielded probe apparatus for probing semiconductor wafer | William A. Funk | 2006-01-31 |
| 6975128 | Electrical, high temperature test probe with conductive driven guard | William A. Funk | 2005-12-13 |
| 6963207 | Apparatus and method for terminating probe apparatus of semiconductor wafer | William A. Funk | 2005-11-08 |
| 6882168 | Probe tile for probing semiconductor wafer | — | 2005-04-19 |
| 6586954 | Probe tile for probing semiconductor wafer | — | 2003-07-01 |
| 6201402 | Probe tile and platform for large area wafer probing | — | 2001-03-13 |