JD

John Dunklee

CM Cascade Microtech: 36 patents #5 of 118Top 5%
CS Celadon Systems: 12 patents #3 of 9Top 35%
IN Intel: 1 patents #18,218 of 30,777Top 60%
📍 Tigard, OR: #10 of 696 inventorsTop 2%
🗺 Oregon: #729 of 28,073 inventorsTop 3%
Overall (All Time): #58,404 of 4,157,543Top 2%
48
Patents All Time

Issued Patents All Time

Showing 26–48 of 48 patents

Patent #TitleCo-InventorsDate
7492172 Chuck for holding a device under test Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann +3 more 2009-02-17
7489149 Shielded probe for testing a device under test K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more 2009-02-10
7482823 Shielded probe for testing a device under test K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more 2009-01-27
7468609 Switched suspended conductor and connection 2008-12-23
7436194 Shielded probe with low contact resistance for testing a device under test K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more 2008-10-14
7423419 Chuck for holding a device under test 2008-09-09
7362115 Chuck with integrated wafer support Peter Andrews, Brad Froemke 2008-04-22
7352168 Chuck for holding a device under test 2008-04-01
7304488 Shielded probe for high-frequency testing of a device under test K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more 2007-12-04
7292057 Probe station thermal chuck with shielding for capacitive current Clarence E. Cowan, Paul A. Tervo 2007-11-06
7250779 Probe station with low inductance path Clarence E. Cowan 2007-07-31
7221172 Switched suspended conductor and connection 2007-05-22
7221146 Guarded tub enclosure Greg Norgden, C. Eugene Cowan 2007-05-22
7187188 Chuck with integrated wafer support Peter Andrews, Brad Froemke 2007-03-06
7161363 Probe for testing a device under test K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more 2007-01-09
7138813 Probe station thermal chuck with shielding for capacitive current Clarence E. Cowan, Paul A. Tervo 2006-11-21
6965226 Chuck for holding a device under test 2005-11-15
6914423 Probe station Greg Nordgren 2005-07-05
6861856 Guarded tub enclosure Greg Norgden, C. Eugene Cowan 2005-03-01
6815963 Probe for testing a device under test K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more 2004-11-09
6642732 Probe station thermal chuck with shielding for capacitive current Clarence E. Cowan, Paul A. Tervo 2003-11-04
6512391 Probe station thermal chuck with shielding for capacitive current Clarence E. Cowan, Paul A. Tervo 2003-01-28
6445202 Probe station thermal chuck with shielding for capacitive current Clarence E. Cowan, Paul A. Tervo 2002-09-03