| 11486898 |
Multi-conductor transmission line probe |
Jason William Cosman |
2022-11-01 |
| 7898273 |
Probe for testing a device under test |
K. Reed Gleason, Mike Andrews, John Martin |
2011-03-01 |
| 7876115 |
Chuck for holding a device under test |
Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann +3 more |
2011-01-25 |
| 7518387 |
Shielded probe for testing a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2009-04-14 |
| 7501842 |
Shielded probe for testing a device under test |
K. Reed Gleason, Mike Andrews, John Martin |
2009-03-10 |
| 7498829 |
Shielded probe for testing a device under test |
K. Reed Gleason, Mike Andrews, John Martin |
2009-03-03 |
| 7492172 |
Chuck for holding a device under test |
Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann +3 more |
2009-02-17 |
| 7489149 |
Shielded probe for testing a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2009-02-10 |
| 7482823 |
Shielded probe for testing a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2009-01-27 |
| 7436194 |
Shielded probe with low contact resistance for testing a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2008-10-14 |
| 7394269 |
Probe for testing a device under test |
K. Reed Gleason, Mike Andrews, John Martin |
2008-07-01 |
| 7304488 |
Shielded probe for high-frequency testing of a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2007-12-04 |
| 7271603 |
Shielded probe for testing a device under test |
K. Reed Gleason, Mike Andrews, John Martin |
2007-09-18 |
| 7161363 |
Probe for testing a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2007-01-09 |
| 7057404 |
Shielded probe for testing a device under test |
K. Reed Gleason, Mike Andrews, John Martin |
2006-06-06 |
| 6815963 |
Probe for testing a device under test |
K. Reed Gleason, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more |
2004-11-09 |