Issued Patents All Time
Showing 25 most recent of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8986475 | Heat transfer labeling machine with hot air treatment stations | Bruce A. Ense | 2015-03-24 |
| 8343104 | Closable and openable catheter assembly and method of using same | Timothy Schweikert, Christopher Linden, Kevin Sanford, Mark S. Fisher, W. Shaun Wall +1 more | 2013-01-01 |
| 8245695 | Method of manufacturing and installation of high pressure liquid LPG fuel supply and dual or mixed fuel supply systems | — | 2012-08-21 |
| 8167676 | Fluorescent lighting system | Lucien Tournie, Douglas Gene Lockie | 2012-05-01 |
| 7898273 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews | 2011-03-01 |
| 7761983 | Method of assembling a wafer probe | Leonard Hayden, Mike Andrews | 2010-07-27 |
| 7688097 | Wafer probe | Leonard Hayden, Mike Andrews | 2010-03-30 |
| 7635654 | Magnetic tunnel junction device with improved barrier layer | Jijun Sun, Jon Slaughter | 2009-12-22 |
| 7618590 | Fluid dispensing system | K. Reed Gleason, Peter Navratil, John Dunklee, Cali Sartor, Thane Allison | 2009-11-17 |
| 7518387 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Dunklee +2 more | 2009-04-14 |
| 7501842 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews | 2009-03-10 |
| 7498829 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews | 2009-03-03 |
| 7495461 | Wafer probe | Leonard Hayden, Mike Andrews | 2009-02-24 |
| 7489149 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Dunklee +2 more | 2009-02-10 |
| 7482823 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Dunklee +2 more | 2009-01-27 |
| 7456646 | Wafer probe | Leonard Hayden, Mike Andrews | 2008-11-25 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Dunklee +2 more | 2008-10-14 |
| 7394269 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews | 2008-07-01 |
| 7352258 | Waveguide adapter for probe assembly having a detachable bias tee | Mike Andrews, Leonard Hayden | 2008-04-01 |
| 7304488 | Shielded probe for high-frequency testing of a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Dunklee +2 more | 2007-12-04 |
| 7298536 | Fiber optic wafer probe | Peter McCann | 2007-11-20 |
| 7271603 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews | 2007-09-18 |
| 7233160 | Wafer probe | Leonard Hayden, Mike Andrews | 2007-06-19 |
| 7161363 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Dunklee +2 more | 2007-01-09 |
| 7057404 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Mike Andrews | 2006-06-06 |