Issued Patents All Time
Showing 25 most recent of 34 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11282923 | Bipolar transistor | Peter J. Zampardi, Jr., Timothy S. Henderson, Adrian Hutchinson | 2022-03-22 |
| 7908107 | Line-reflect-reflect match calibration | — | 2011-03-15 |
| 7761983 | Method of assembling a wafer probe | John Martin, Mike Andrews | 2010-07-27 |
| 7688097 | Wafer probe | John Martin, Mike Andrews | 2010-03-30 |
| 7626379 | Probe station having multiple enclosures | Ron A. Peters, Jeffrey A. Hawkins, R. Mark Dougherty | 2009-12-01 |
| 7518387 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2009-04-14 |
| 7495461 | Wafer probe | John Martin, Mike Andrews | 2009-02-24 |
| 7489149 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2009-02-10 |
| 7482823 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2009-01-27 |
| 7456646 | Wafer probe | John Martin, Mike Andrews | 2008-11-25 |
| 7453276 | Probe for combined signals | Scott Rumbaugh, Mike Andrews | 2008-11-18 |
| 7436170 | Probe station having multiple enclosures | Ron A. Peters, Jeffrey A. Hawkins, R. Mark Dougherty | 2008-10-14 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2008-10-14 |
| 7417446 | Probe for combined signals | Scott Rumbaugh, Mike Andrews | 2008-08-26 |
| 7352258 | Waveguide adapter for probe assembly having a detachable bias tee | Mike Andrews, John Martin | 2008-04-01 |
| 7304488 | Shielded probe for high-frequency testing of a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2007-12-04 |
| 7285969 | Probe for combined signals | Scott Rumbaugh, Mike Andrews | 2007-10-23 |
| 7250752 | Probe station having multiple enclosures | Ron A. Peters, Jeffrey A. Hawkins, R. Mark Dougherty | 2007-07-31 |
| 7233160 | Wafer probe | John Martin, Mike Andrews | 2007-06-19 |
| 7205784 | Probe for combined signals | Scott Rumbaugh, Mike Andrews | 2007-04-17 |
| 7190181 | Probe station having multiple enclosures | Ron A. Peters, Jeffrey A. Hawkins, R. Mark Dougherty | 2007-03-13 |
| 7161363 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin +2 more | 2007-01-09 |
| 7075320 | Probe for combined signals | Scott Rumbaugh, Mike Andrews | 2006-07-11 |
| 7046023 | Probe for combined signals | Scott Rumbaugh, Mike Andrews | 2006-05-16 |
| 6842024 | Probe station having multiple enclosures | Ron A. Peters, Jeffrey A. Hawkins, R. Mark Dougherty | 2005-01-11 |