| 7898273 |
Probe for testing a device under test |
K. Reed Gleason, Tim Lesher, John Martin |
2011-03-01 |
$604,000 |
| 7761983 |
Method of assembling a wafer probe |
Leonard Hayden, John Martin |
2010-07-27 |
$264,000 |
| 7688097 |
Wafer probe |
Leonard Hayden, John Martin |
2010-03-30 |
$324,000 |
| 7609077 |
Differential signal probe with integral balun |
Richard Campbell, Eric W. Strid |
2009-10-27 |
$1,947,000 |
| 7535878 |
Method, apparatus and system for ensuring reliable access to a roaming mobile node |
Farid Adrangi, Ranjit S. Narjala |
2009-05-19 |
$16,372,000 |
| 7518387 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more |
2009-04-14 |
$598,000 |
| 7501842 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, John Martin |
2009-03-10 |
$342,000 |
| 7498829 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, John Martin |
2009-03-03 |
$402,000 |
| 7495461 |
Wafer probe |
Leonard Hayden, John Martin |
2009-02-24 |
$731,000 |
| 7489149 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more |
2009-02-10 |
$943,000 |
| 7482823 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more |
2009-01-27 |
$931,000 |
| 7456646 |
Wafer probe |
Leonard Hayden, John Martin |
2008-11-25 |
$520,000 |
| 7453276 |
Probe for combined signals |
Leonard Hayden, Scott Rumbaugh |
2008-11-18 |
$659,000 |
| 7436194 |
Shielded probe with low contact resistance for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more |
2008-10-14 |
$338,000 |
| 7417446 |
Probe for combined signals |
Leonard Hayden, Scott Rumbaugh |
2008-08-26 |
$783,000 |
| 7394269 |
Probe for testing a device under test |
K. Reed Gleason, Tim Lesher, John Martin |
2008-07-01 |
$864,000 |
| 7352258 |
Waveguide adapter for probe assembly having a detachable bias tee |
Leonard Hayden, John Martin |
2008-04-01 |
$433,000 |
| 7304488 |
Shielded probe for high-frequency testing of a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more |
2007-12-04 |
$798,000 |
| 7285969 |
Probe for combined signals |
Leonard Hayden, Scott Rumbaugh |
2007-10-23 |
$761,000 |
| 7271603 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, John Martin |
2007-09-18 |
$680,000 |
| 7233160 |
Wafer probe |
Leonard Hayden, John Martin |
2007-06-19 |
$766,000 |
| 7205784 |
Probe for combined signals |
Leonard Hayden, Scott Rumbaugh |
2007-04-17 |
$921,000 |
| 7161363 |
Probe for testing a device under test |
K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more |
2007-01-09 |
$994,000 |
| 7075320 |
Probe for combined signals |
Leonard Hayden, Scott Rumbaugh |
2006-07-11 |
$1,220,000 |
| 7057404 |
Shielded probe for testing a device under test |
K. Reed Gleason, Tim Lesher, John Martin |
2006-06-06 |
|
