Issued Patents All Time
Showing 25 most recent of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7898273 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, John Martin | 2011-03-01 |
| 7761983 | Method of assembling a wafer probe | Leonard Hayden, John Martin | 2010-07-27 |
| 7688097 | Wafer probe | Leonard Hayden, John Martin | 2010-03-30 |
| 7609077 | Differential signal probe with integral balun | Richard Campbell, Eric W. Strid | 2009-10-27 |
| 7535878 | Method, apparatus and system for ensuring reliable access to a roaming mobile node | Farid Adrangi, Ranjit S. Narjala | 2009-05-19 |
| 7518387 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more | 2009-04-14 |
| 7501842 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, John Martin | 2009-03-10 |
| 7498829 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, John Martin | 2009-03-03 |
| 7495461 | Wafer probe | Leonard Hayden, John Martin | 2009-02-24 |
| 7489149 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more | 2009-02-10 |
| 7482823 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more | 2009-01-27 |
| 7456646 | Wafer probe | Leonard Hayden, John Martin | 2008-11-25 |
| 7453276 | Probe for combined signals | Leonard Hayden, Scott Rumbaugh | 2008-11-18 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more | 2008-10-14 |
| 7417446 | Probe for combined signals | Leonard Hayden, Scott Rumbaugh | 2008-08-26 |
| 7394269 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, John Martin | 2008-07-01 |
| 7352258 | Waveguide adapter for probe assembly having a detachable bias tee | Leonard Hayden, John Martin | 2008-04-01 |
| 7304488 | Shielded probe for high-frequency testing of a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more | 2007-12-04 |
| 7285969 | Probe for combined signals | Leonard Hayden, Scott Rumbaugh | 2007-10-23 |
| 7271603 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, John Martin | 2007-09-18 |
| 7233160 | Wafer probe | Leonard Hayden, John Martin | 2007-06-19 |
| 7205784 | Probe for combined signals | Leonard Hayden, Scott Rumbaugh | 2007-04-17 |
| 7161363 | Probe for testing a device under test | K. Reed Gleason, Tim Lesher, Eric W. Strid, John Martin, John Dunklee +2 more | 2007-01-09 |
| 7075320 | Probe for combined signals | Leonard Hayden, Scott Rumbaugh | 2006-07-11 |
| 7057404 | Shielded probe for testing a device under test | K. Reed Gleason, Tim Lesher, John Martin | 2006-06-06 |