Issued Patents All Time
Showing 25 most recent of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9874585 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | Kenneth R. Smith, Mike Jolley, Eric W. Strid, Peter Hanaway, Koby L. Duckworth | 2018-01-23 |
| 9372214 | High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same | Eric W. Strid, Richard Campbell, Kenneth R. Smith, Kooho Jung | 2016-06-21 |
| 9099449 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | Kenneth R. Smith, Mike Jolley, Eric W. Strid, Peter Hanaway, Koby L. Duckworth | 2015-08-04 |
| 8970240 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | Kenneth R. Smith, Mike Jolley, Eric W. Strid, Peter Hanaway, Koby L. Duckworth | 2015-03-03 |
| 8451017 | Membrane probing method using improved contact | Michael A. Bayne, Kenneth R. Smith, Timothy Lesher, Martin Koxxy | 2013-05-28 |
| 7898273 | Probe for testing a device under test | Tim Lesher, Mike Andrews, John Martin | 2011-03-01 |
| 7893704 | Membrane probing structure with laterally scrubbing contacts | Kenneth R. Smith, Mike Bayne | 2011-02-22 |
| 7759953 | Active wafer probe | Eric W. Strid | 2010-07-20 |
| 7618590 | Fluid dispensing system | Peter Navratil, John Martin, John Dunklee, Cali Sartor, Thane Allison | 2009-11-17 |
| 7550983 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 2009-06-23 |
| 7541821 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 2009-06-02 |
| 7518387 | Shielded probe for testing a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2009-04-14 |
| 7501842 | Shielded probe for testing a device under test | Tim Lesher, Mike Andrews, John Martin | 2009-03-10 |
| 7498829 | Shielded probe for testing a device under test | Tim Lesher, Mike Andrews, John Martin | 2009-03-03 |
| 7489149 | Shielded probe for testing a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2009-02-10 |
| 7482823 | Shielded probe for testing a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2009-01-27 |
| 7436194 | Shielded probe with low contact resistance for testing a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2008-10-14 |
| 7427868 | Active wafer probe | Eric W. Strid | 2008-09-23 |
| 7394269 | Probe for testing a device under test | Tim Lesher, Mike Andrews, John Martin | 2008-07-01 |
| 7321233 | System for evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 2008-01-22 |
| 7304488 | Shielded probe for high-frequency testing of a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2007-12-04 |
| 7271603 | Shielded probe for testing a device under test | Tim Lesher, Mike Andrews, John Martin | 2007-09-18 |
| 7164279 | System for evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 2007-01-16 |
| 7161363 | Probe for testing a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2007-01-09 |
| 7109731 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 2006-09-19 |