KD

Koby L. Duckworth

CM Cascade Microtech: 5 patents #36 of 118Top 35%
AM AMD: 2 patents #3,994 of 9,279Top 45%
FB Formfactor Beaverton: 2 patents #4 of 39Top 15%
FO Formfactor: 1 patents #105 of 177Top 60%
Overall (All Time): #502,524 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11047879 Probe systems and methods Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones 2021-06-29
10877070 Probes with fiducial targets, probe systems including the same, and associated methods Joseph George Frankel, Kazuki Negishi 2020-12-29
10459006 Probe systems and methods Gavin Neil Fisher, Thomas Reiner Thaerigen, Peter McCann, Rodney Jones 2019-10-29
9989558 Probe head assemblies, components thereof, test systems including the same, and methods of operating the same Eric Lyell Hill 2018-06-05
9874585 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Kenneth R. Smith, Mike Jolley, Eric W. Strid, Peter Hanaway, K. Reed Gleason 2018-01-23
9244099 Probe head assemblies, components thereof, test systems including the same, and methods of operating the same Eric Lyell Hill 2016-01-26
9099449 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Kenneth R. Smith, Mike Jolley, Eric W. Strid, Peter Hanaway, K. Reed Gleason 2015-08-04
8970240 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Kenneth R. Smith, Mike Jolley, Eric W. Strid, Peter Hanaway, K. Reed Gleason 2015-03-03
6674296 Probe card measurement tool Marian C. Estrada 2004-01-06
6429671 Electrical test probe card having a removable probe head assembly with alignment features and a method for aligning the probe head assembly to the probe card Miguel L. Islas, Timothy Eric Gilliam 2002-08-06