Issued Patents All Time
Showing 26–46 of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7057404 | Shielded probe for testing a device under test | Tim Lesher, Mike Andrews, John Martin | 2006-06-06 |
| 6987398 | System for evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 2006-01-17 |
| 6927585 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 2005-08-09 |
| 6815963 | Probe for testing a device under test | Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee +2 more | 2004-11-09 |
| 6803779 | Interconnect assembly for use in evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 2004-10-12 |
| 6608496 | Reference transmission line junction for probing device | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 2003-08-19 |
| 6437584 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 2002-08-20 |
| 6307387 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 2001-10-23 |
| 6130544 | System for evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 2000-10-10 |
| 5973505 | System for evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 1999-10-26 |
| 5914613 | Membrane probing system with local contact scrub | Kenneth R. Smith, Mike Bayne | 1999-06-22 |
| 5869975 | System for evaluating probing networks that have multiple probing ends | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 1999-02-09 |
| 5659255 | Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 1997-08-19 |
| 5561377 | System for evaluating probing networks | Eric W. Strid, Jerry B. Schappacher, Dale E. Carlton | 1996-10-01 |
| 5264788 | Adjustable strap implemented return line for a probe station | Kenneth R. Smith, Jeffrey A. Williams, Laura L. Spargur | 1993-11-23 |
| 5045781 | High-frequency active probe having replaceable contact needles | Keith E. Jones | 1991-09-03 |
| 5012186 | Electrical probe with contact force protection | — | 1991-04-30 |
| 5006793 | High-frequency active probe having replaceable contact needles | Keith E. Jones | 1991-04-09 |
| 4891612 | Overlap interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignment | Keith E. Jones, Eric W. Strid | 1990-01-02 |
| 4849689 | Microwave wafer probe having replaceable probe tip | Keith E. Jones, Eric W. Strid | 1989-07-18 |
| 4231058 | Tungsten-titanium-chromium/gold semiconductor metallization | — | 1980-10-28 |