Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6512391 | Probe station thermal chuck with shielding for capacitive current | Clarence E. Cowan, John Dunklee | 2003-01-28 |
| 6492822 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2002-12-10 |
| 6486687 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2002-11-26 |
| 6445202 | Probe station thermal chuck with shielding for capacitive current | Clarence E. Cowan, John Dunklee | 2002-09-03 |
| 6380751 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2002-04-30 |
| 6335628 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2002-01-01 |
| 6313649 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 2001-11-06 |
| 6232788 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 2001-05-15 |
| 6034533 | Low-current pogo probe card | Clarence E. Cowan | 2000-03-07 |
| 5663653 | Wafer probe station for low-current measurements | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner | 1997-09-02 |
| 5604444 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 1997-02-18 |
| 5532609 | Wafer probe station having environment control enclosure | Warren K. Harwood, Martin Koxxy | 1996-07-02 |
| 5457398 | Wafer probe station having full guarding | Randy Schwindt, Warren K. Harwood | 1995-10-10 |
| 5434512 | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner, Peter Andrews | 1995-07-18 |
| 5345170 | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Randy Schwindt, Warren K. Harwood, Kenneth R. Smith, Richard H. Warner, Peter Andrews | 1994-09-06 |
| 5266889 | Wafer probe station with integrated environment control enclosure | Warren K. Harwood, Martin Koxxy | 1993-11-30 |
| 5237267 | Wafer probe station having auxiliary chucks | Warren K. Harwood, Richard H. Warner | 1993-08-17 |