KS

Kenneth R. Smith

CM Cascade Microtech: 47 patents #1 of 118Top 1%
GE Geometrics: 7 patents #1 of 14Top 8%
Tektronix: 3 patents #378 of 1,698Top 25%
BG Bicc-Vero Electronics Gmbh: 1 patents #2 of 5Top 40%
FB Formfactor Beaverton: 1 patents #11 of 39Top 30%
UA US Army: 1 patents #2,720 of 6,974Top 40%
📍 Beaverton, OR: #64 of 3,140 inventorsTop 3%
🗺 Oregon: #470 of 28,073 inventorsTop 2%
Overall (All Time): #34,880 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 26–50 of 64 patents

Patent #TitleCo-InventorsDate
7368927 Probe head having a membrane suspended probe Michael Jolley, Victoria Van Syckel 2008-05-06
7355420 Membrane probing system Reed Gleason 2008-04-08
7330023 Wafer probe station having a skirting component Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2008-02-12
7266889 Membrane probing system Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2007-09-11
7178236 Method for constructing a membrane probe using a depression Reed Gleason, Michael A. Bayne 2007-02-20
7148711 Membrane probing system Paul A. Tervo, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy 2006-12-12
7109731 Membrane probing system with local contact scrub K. Reed Gleason, Mike Bayne 2006-09-19
6980012 Wafer probe station for low-current measurements Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2005-12-27
6930498 Membrane probing system Paul A. Tervo, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy 2005-08-16
6927585 Membrane probing system with local contact scrub K. Reed Gleason, Mike Bayne 2005-08-09
6860009 Probe construction using a recess Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2005-03-01
6859162 Underground object locating system without direction ambiguity 2005-02-22
6838890 Membrane probing system Paul A. Tervo, Clarence E. Cowan, Mike P. Dauphinais, Martin Koxxy 2005-01-04
6825677 Membrane probing system Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2004-11-30
6720782 Wafer probe station for low-current measurements Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2004-04-13
6708386 Method for probing an electrical device having a layer of oxide thereon Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2004-03-23
6578264 Method for constructing a membrane probe using a depression Reed Gleason, Michael A. Bayne 2003-06-17
6527305 Fuel line coupling system 2003-03-04
6492822 Wafer probe station for low-current measurements Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2002-12-10
6437584 Membrane probing system with local contact scrub K. Reed Gleason, Mike Bayne 2002-08-20
6335628 Wafer probe station for low-current measurements Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2002-01-01
6307387 Membrane probing system with local contact scrub K. Reed Gleason, Mike Bayne 2001-10-23
6256882 Membrane probing system Reed Gleason, Michael A. Bayne, Timothy Lesher, Martin Koxxy 2001-07-10
6232788 Wafer probe station for low-current measurements Randy Schwindt, Warren K. Harwood, Paul A. Tervo, Richard H. Warner 2001-05-15
6064217 Fine pitch contact device employing a compliant conductive polymer bump 2000-05-16