Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10754260 | Method and system for process control with flexible sampling | Onur N. Demirer, Roie Volkovich, William Pierson, Dana Klein | 2020-08-25 |
| 10685165 | Metrology using overlay and yield critical patterns | Daniel Kandel, Mark D. Smith, Eran Amit, Myungjun Lee | 2020-06-16 |
| 10643286 | Knowledge management tool interface | Sandra J. Stevens, Belinda A. Lellock, Anthony Jason Ma'luf, Kurt E. Grashaw | 2020-05-05 |
| 10402461 | Virtual inspection systems for process window characterization | Laurent Karsenti, Kris Bhaskar, Brian Duffy, Vijayakumar Ramachandran | 2019-09-03 |
| 10217171 | System to administer insurance knowledge management tool | Sandra J. Stevens, Belinda A. Lellock, Anthony Jason Ma'luf, Kurt E. Grashaw | 2019-02-26 |
| 9903711 | Feed forward of metrology data in a metrology system | Ady Levy, Daniel Kandel, Michael Adel, Leonid Poslavsky, John Robinson +9 more | 2018-02-27 |
| 9806885 | Dual use cryptographic system and method | Joshua Breitbach, Adriane R. Van Auken, Jerome L. Schmidt, Kevin M. Bayer | 2017-10-31 |
| 9612541 | Qualifying patterns for microlithography | Rui-fang Shi | 2017-04-04 |
| 9576861 | Method and system for universal target based inspection and metrology | Allen Park, Ellis Chang, Michael Adel, Kris Bhaskar, Ady Levy +2 more | 2017-02-21 |
| 9424636 | Method for measuring positions of structures on a mask and thereby determining mask manufacturing errors | Frank Laske, Mohammad Mehdi Daneshpanah, Slawomir Czerkas | 2016-08-23 |
| 9367877 | System for electronic administration of employee skill certification badge program | Jason K. Gallaway, Willis D Schmidt, Jr., Jodi Greenspan Kirsch, Richard A. Bowman, Senthil Nathan +1 more | 2016-06-14 |
| 8160350 | Method and system for evaluating a variation in a parameter of a pattern | Michael Ben Yishai, Avishai Bartov, Gadi Greenberg, Lior Shoval, Ophir Gvirtzer | 2012-04-17 |
| 6018314 | Method for obtaining PPS accuracy using an unclassified GPS receiver measurement interface | Steven A. Harshbarger, Jean J. Pollari | 2000-01-25 |