SC

Slawomir Czerkas

VG Vistec Semiconductor Systems Gmbh: 3 patents #12 of 55Top 25%
KL Kla-Tencor: 2 patents #566 of 1,394Top 45%
📍 Weilburg, DE: #8 of 25 inventorsTop 35%
Overall (All Time): #980,920 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
10303153 Method and computer program product for controlling the positioning of patterns on a substrate in a manufacturing process Frank Laske 2019-05-28
9424636 Method for measuring positions of structures on a mask and thereby determining mask manufacturing errors Frank Laske, Mohammad Mehdi Daneshpanah, Mark Wagner 2016-08-23
8149383 Method for determining the systematic error in the measurement of positions of edges of structures on a substrate resulting from the substrate topology 2012-04-03
8115808 Coordinate measuring machine and method for calibrating the coordinate measuring machine Wolfgang Fricke, Klaus Rinn 2012-02-14
7826068 Method for correcting measured values resulting from the bending of a substrate 2010-11-02