WF

Wolfgang Fricke

VG Vistec Semiconductor Systems Gmbh: 4 patents #8 of 55Top 15%
DA Danaher: 1 patents #1,463 of 2,950Top 50%
Overall (All Time): #1,016,728 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
8115808 Coordinate measuring machine and method for calibrating the coordinate measuring machine Klaus Rinn, Slawomir Czerkas 2012-02-14
7978340 System and method for determining positions of structures on a substrate Hans-Artur Boesser, Michael Heiden 2011-07-12
7584072 Method for determining correction values for the measured values of positions of structures on a substrate Linda Gundal 2009-09-01
7551296 Method for determining the focal position of at least two edges of structures on a substrate Hans-Artur Boesser, Klaus-Dieter Adam 2009-06-23
6920249 Method and measuring instrument for determining the position of an edge of a pattern element on a substrate Klaus Rinn, Joachim Wienecke 2005-07-19